"Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type." . "[C5C580BA032D]" . . "2"^^ . . "Elhadidy, Hassan Ali Mohamed" . . "Elhadidy, Hassan Ali Mohamed" . "Vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Brn\u011B" . . . "NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS"@en . "2012-06-28+02:00"^^ . . "CdTe detector, Polarization, Pockels measurements, Noise"@en . "Franc, Jan" . . . . "RIV/00216305:26220/12:PU99049!RIV13-GA0-26220___" . "Proc. of EDS IMAPS CS 2012. Brno" . "RIV/00216305:26220/12:PU99049" . "26220" . . "NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS" . "7"^^ . "NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS"@en . . "Brno, Anton\u00EDnsk\u00E1 548/1" . "154319" . . . "\u0160ikula, Josef" . "NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS" . . "Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type."@en . . . . "5"^^ . "Brno" . "\u0160ik, Ond\u0159ej" . . "P(ED2.1.00/03.0072), P(GAP102/11/0995)" . "978-80-214-4539-0" . "D\u011Bdi\u010D, V\u00E1clav" . .