. "Emission Current Fluctuations vs. Beam Lightning of the Field-Emission Cathode"@en . "5"^^ . . "Emission Current Fluctuations vs. Beam Lightning of the Field-Emission Cathode"@en . "RIV/00216305:26220/12:PU98285!RIV13-GA0-26220___" . . . "26220" . "134193" . "Litera Brno" . "Emission Current Fluctuations vs. Beam Lightning of the Field-Emission Cathode" . . "Emission Current Fluctuations vs. Beam Lightning of the Field-Emission Cathode" . "1"^^ . . . "P(GAP102/11/0995), P(GD102/09/H074)" . . "978-80-214-4462-1" . "RIV/00216305:26220/12:PU98285" . . . "1"^^ . "Student EEICT - Proceedings of the 18th Conference vol.3" . . . . "[5A5D145CDF11]" . . "field emission stability, tungsten cathodes, Allan dispersion"@en . . "2012-04-26+02:00"^^ . "Brno" . "Paper deals with noise diagnostics which was performed on the cold field emission cathode in high-vacuum conditions (HV). Used cold field-emission cathode is designed to be used in low-voltage TEM, and is based on tungsten cathode with ultra-sharp nano-tip. The cathode is additionally coated by epoxy resin to stabilize the emission current, providing small and stable source of electrons. Technological issues are further examined by the means of the noise diagnostics, which provides information about carrier transport and cathode performance in general. The analysis was performed both in time and frequency domain. Mutual correlation between the current noise spectral-density, extractor voltage, beam brightness and Allan dispersion were analyzed, together with the main sources of noise."@en . "Brno" . . . "Paper deals with noise diagnostics which was performed on the cold field emission cathode in high-vacuum conditions (HV). Used cold field-emission cathode is designed to be used in low-voltage TEM, and is based on tungsten cathode with ultra-sharp nano-tip. The cathode is additionally coated by epoxy resin to stabilize the emission current, providing small and stable source of electrons. Technological issues are further examined by the means of the noise diagnostics, which provides information about carrier transport and cathode performance in general. The analysis was performed both in time and frequency domain. Mutual correlation between the current noise spectral-density, extractor voltage, beam brightness and Allan dispersion were analyzed, together with the main sources of noise." . . "Kn\u00E1pek, Alexandr" .