. "978-80-214-4579-6" . . "RIV/00216305:26220/12:PU104334!RIV14-MSM-26220___" . . "Vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Brn\u011B. Fakulta elektrotechniky a komunika\u010Dn\u00EDch technologi\u00ED" . "TEMPERATURE AND FREQUENCY DEPENDENCE OF COMPLEX PERMITTIVITY FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITOR" . . "TEMPERATURE AND FREQUENCY DEPENDENCE OF COMPLEX PERMITTIVITY FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITOR"@en . "The complex permittivity of thin oxide film at commercial niobium oxide capacitor was measured at different temperature range 218-373 K by using Janis cryostat system, with HP 4284A impedance analyzer with frequencies from 20 Hz to 1MHz. The real part of complex permittivity increases with temperature and decreases with frequency, the imaginary part of complex permittivity displays abroad maximum peak whose position shifts with temperature to a higher frequency region with an activation energy 0.055 eV. The measured imaginary parts of complex permittivity were studied by the graphical analysis of the obtained data as proposed by Havriliak -Negami (HN) equation." . . "TEMPERATURE AND FREQUENCY DEPENDENCE OF COMPLEX PERMITTIVITY FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITOR"@en . . . . . "Vset\u00EDn" . "The complex permittivity of thin oxide film at commercial niobium oxide capacitor was measured at different temperature range 218-373 K by using Janis cryostat system, with HP 4284A impedance analyzer with frequencies from 20 Hz to 1MHz. The real part of complex permittivity increases with temperature and decreases with frequency, the imaginary part of complex permittivity displays abroad maximum peak whose position shifts with temperature to a higher frequency region with an activation energy 0.055 eV. The measured imaginary parts of complex permittivity were studied by the graphical analysis of the obtained data as proposed by Havriliak -Negami (HN) equation."@en . "2012-08-29+02:00"^^ . . "Abuetwirat, Inas Faisel" . "[6DF4517B549E]" . "Proceedings of the conference VSACK\u00DD C\u00C1B 2012" . . . "TEMPERATURE AND FREQUENCY DEPENDENCE OF COMPLEX PERMITTIVITY FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITOR" . "173693" . "Abuetwirat, Inas Faisel" . . "Chv\u00E1tal, Milo\u0161" . "26220" . . "4"^^ . "RIV/00216305:26220/12:PU104334" . "Real part of complex permittivity, imaginary part of complex permittivity, niobium oxide capacitor, Havriliak-Negami equation."@en . "1"^^ . . "S" . "VSACK\u00DD C\u00C1B" . "2"^^ . .