. "140311" . "Dallaeva, Dinara" . . "Neuveden" . "Solar cell, local defect, fractured surface, nondestructive testing."@en . "978-5-905576-18-8" . . "Identification of Micro-scale Defects in Crystalline Solar Cell Structure"@en . . . "26220" . . "\u0160icner, Ji\u0159\u00ED" . "Identification of Micro-scale Defects in Crystalline Solar Cell Structure"@en . . "Kaza\u0148" . "[131C62471043]" . "Dallaeva, Dinara" . "Identification of Micro-scale Defects in Crystalline Solar Cell Structure" . "Kaza\u0148" . "The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects."@en . "Fracture Mechanics for Durability, Reliability and Safety" . . . "Koktav\u00FD, Pavel" . . . . "The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects." . "Identification of Micro-scale Defects in Crystalline Solar Cell Structure" . . . "8"^^ . . . "2012-08-26+02:00"^^ . . "P(FR-TI1/305), P(GAP102/10/2013), P(GD102/09/H074)" . . "RIV/00216305:26220/12:PU101179!RIV13-MPO-26220___" . . "RIV/00216305:26220/12:PU101179" . . "3"^^ . "3"^^ . .