. "1"^^ . "Measurement induced solar cell defect characterization"@en . "RIV/00216305:26220/11:PU92272!RIV12-MSM-26220___" . . . "5"^^ . . . . "Measurement induced solar cell defect characterization"@en . . "solar cell, nondestructive testing, imperfections"@en . "P(GD102/09/H074), Z(MSM0021630503)" . "Novpress" . . "211022" . . . "Light emission from reverse biased solar cell can reveal structure inhomogenity. Although there is large variety of defects, this paper shows simple method for their basic classification. The method allows to determine imperfections caused by mechanical damage of sample (mi-crocracks and structure snapping). It is based on the measurement of light emission at fixed reverse voltage while the temperature is changing in the range of 20 K. Experimental light emission results are consequently correlated with light induced beam current map." . . "Light emission from reverse biased solar cell can reveal structure inhomogenity. Although there is large variety of defects, this paper shows simple method for their basic classification. The method allows to determine imperfections caused by mechanical damage of sample (mi-crocracks and structure snapping). It is based on the measurement of light emission at fixed reverse voltage while the temperature is changing in the range of 20 K. Experimental light emission results are consequently correlated with light induced beam current map."@en . "RIV/00216305:26220/11:PU92272" . . . "2011-04-28+02:00"^^ . . "Measurement induced solar cell defect characterization" . . . . "26220" . "proceedings of the 17th conference student eeict 2011 vol. 3" . "[A762C5C6B5DE]" . "1"^^ . . "Brno" . "Brno" . . "Measurement induced solar cell defect characterization" . "978-80-214-4273-3" . "\u0160karvada, Pavel" .