"H\u00E9gr, Ond\u0159ej" . . . "296434" . "Fixed-charge measurement of passivation layers for silicon solar cells"@en . "Mikrosyn. Nov\u00E9 trendy v mikroelektonick\u00FDch syst\u00E9mech a nanotechnologi\u00EDch" . . "N\u00E1pln\u00ED \u010Dl\u00E1nku je re\u0161er\u0161e mo\u017Enost\u00ED experiment\u00E1ln\u00EDho m\u011B\u0159en\u00ED v\u00E1zan\u00E9ho n\u00E1boje v tenk\u00FDch dielektrick\u00FDch vrstv\u00E1ch pomoc\u00ED povrchov\u00E9 nap\u011Bt\u00ED a popis \u00FAvodn\u00EDch experiment\u016F. V pr\u00E1ci jsou pops\u00E1na experiment\u00E1ln\u00ED m\u011B\u0159en\u00ED dielektrick\u00FDch vrstev Al2O3, AlN, SiNx, Y2O3 deponovan\u00FDch na krystalick\u00E9m k\u0159em\u00EDku. Povrchov\u00E9 nap\u011Bt\u00ED (tj. voln\u00E1 povrchov\u00E1 energie) je vyhodnocov\u00E1no z velikosti \u00FAhlu sm\u00E1\u010Den\u00ED (kontaktn\u00EDho \u00FAhlu) pomoc\u00ED See Systemu."@cs . . . "2010-12-14+01:00"^^ . . . "978-80-214-4229-0" . . "N\u00E1pln\u00ED \u010Dl\u00E1nku je re\u0161er\u0161e mo\u017Enost\u00ED experiment\u00E1ln\u00EDho m\u011B\u0159en\u00ED v\u00E1zan\u00E9ho n\u00E1boje v tenk\u00FDch dielektrick\u00FDch vrstv\u00E1ch pomoc\u00ED povrchov\u00E9 nap\u011Bt\u00ED a popis \u00FAvodn\u00EDch experiment\u016F. V pr\u00E1ci jsou pops\u00E1na experiment\u00E1ln\u00ED m\u011B\u0159en\u00ED dielektrick\u00FDch vrstev Al2O3, AlN, SiNx, Y2O3 deponovan\u00FDch na krystalick\u00E9m k\u0159em\u00EDku. Povrchov\u00E9 nap\u011Bt\u00ED (tj. voln\u00E1 povrchov\u00E1 energie) je vyhodnocov\u00E1no z velikosti \u00FAhlu sm\u00E1\u010Den\u00ED (kontaktn\u00EDho \u00FAhlu) pomoc\u00ED See Systemu." . . "This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System."@en . . . "Fixed-charge measurement of passivation layers for silicon solar cells"@en . . "26220" . "Vliv v\u00E1zan\u00E9ho n\u00E1boje na velikost povrchov\u00E9ho nap\u011Bt\u00ED v pasiva\u010Dn\u00EDch vrstv\u00E1ch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F"@cs . . "Vliv v\u00E1zan\u00E9ho n\u00E1boje na velikost povrchov\u00E9ho nap\u011Bt\u00ED v pasiva\u010Dn\u00EDch vrstv\u00E1ch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F"@cs . . "3"^^ . "3"^^ . "[589C13CD128F]" . . . "Brno" . "Brno" . "RIV/00216305:26220/10:PU90214!RIV11-MSM-26220___" . . . "Bou\u0161ek, Jaroslav" . . . . . . "RIV/00216305:26220/10:PU90214" . "5"^^ . "Novpress" . "Mojrov\u00E1, Barbora" . "Vliv v\u00E1zan\u00E9ho n\u00E1boje na velikost povrchov\u00E9ho nap\u011Bt\u00ED v pasiva\u010Dn\u00EDch vrstv\u00E1ch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F" . . "Passivation layers, Antireflection coating, Fixed charge, Back surface field, Surface free energy, Surface tension, Contact angle, See System, Solar cell"@en . "Z(MSM0021630503)" . "Vliv v\u00E1zan\u00E9ho n\u00E1boje na velikost povrchov\u00E9ho nap\u011Bt\u00ED v pasiva\u010Dn\u00EDch vrstv\u00E1ch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F" .