"2010-03-15+01:00"^^ . "Tacano, Munecazu" . . . . . . . . . "The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than"@en . . "CARTS USA 2010 PROCEEDINGS" . "Electronic Components Association" . "New Orleans" . "RIV/00216305:26220/10:PU89315!RIV11-GA0-26220___" . "26220" . "3"^^ . "Morohoshi, Y." . . "The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than" . . "Tanuma, Nobuhisa" . "0-7908-0150-7" . . "\u0160ikula, Josef" . . "P(GA102/09/1920), Z(MSM0021630503)" . "USA,New Orleans" . "RIV/00216305:26220/10:PU89315" . "LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs" . . . "7"^^ . "Ohya, H." . . "Sedl\u00E1kov\u00E1, Vlasta" . . "LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs" . "Kopeck\u00FD, Martin" . . "7"^^ . . "LEAKAGE CURRENT, NOISE, RELIABILITY , HIGH VOLTAGE ,MLCCs"@en . "268070" . . . "LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs"@en . "[9B626850725F]" . "LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs"@en . .