"Dielectrics, relaxation, molecular dynamics, spectroscopy, tantalum oxide"@en . "978-80-8086-122-3" . "RIV/00216305:26220/09:PU82502!RIV10-MSM-26220___" . . . "Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements"@en . "3"^^ . . "2009-10-14+02:00"^^ . . "Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers"@en . . . . "Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements" . "Ko\u0161ice, SLovensk\u00E1 republika" . "Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers" . "3"^^ . . . . "Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers"@en . "Abuetwirat, Inas Faisel" . "[5FF7ED46C6FC]" . "FEI TU Ko\u0161i\u010De" . . "4"^^ . . "310408" . "Holcman, Vladim\u00EDr" . "26220" . "Physics of Materials 2009" . . "RIV/00216305:26220/09:PU82502" . . . "Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers" . "Liedermann, Karel" . "Abuetwirat, Inas Faisel" . . . "Ko\u0161ice" . . . "Z(MSM0021630503)" .