. "6"^^ . . "Han\u00E1k, Pavel" . "Prototyp je ulo\u017Een na pracovi\u0161ti: \u00DAstav telekomunikac\u00ED, FEKT VUTBR Purky\u0148ova 118 61200 Brno" . . "[44C9E65DA164]" . "Sysel, Petr" . . "6"^^ . . "Koutn\u00FD, Martin" . . "P(FT-TA3/011), Z(MSM0021630513)" . . . "RIV/00216305:26220/09:PR24121!RIV11-MPO-26220___" . . . "Tester of subscriber submodules based on Si32xx integrated circuits"@en . . "Rozm\u011Bry 72x60x53 cm, hmotnost 22 kg, p\u0159\u00EDkon 150 W. V\u017Edy testov\u00E1n jeden \u00FA\u010Dastnick\u00FD submodul, doba kompletn\u00EDho testu je cca 96 sekund. Na vyu\u017Eit\u00ED v\u00FDsledku byla dne 11.7.2005 uzav\u0159ena smlouva s firmou Westcom, s.r.o., I\u010CO 25536851." . . "345989" . . . "Silicon Labs Si32xx, automatic tester, telephone line"@en . "Tester \u00FA\u010Dastnick\u00FDch submodul\u016F zalo\u017Een\u00FDch na obvodech Si32xx" . "Vrba, Kamil" . "Tester \u00FA\u010Dastnick\u00FDch submodul\u016F zalo\u017Een\u00FDch na obvodech Si32xx" . "N\u00E1klady na v\u00FDrobu jednoho testeru jsou p\u0159ibli\u017En\u011B 84 tis. K\u010D." . . "Tester Si M01" . "\u0160mirg, Ond\u0159ej" . . "Tester \u00FA\u010Dastnick\u00FDch submodul\u016F zalo\u017Een\u00FDch na obvodech Si32xx"@cs . . "Krajsa, Ond\u0159ej" . . . "Tester Si M01 je navr\u017Een speci\u00E1ln\u011B pro testov\u00E1n\u00ED \u00FA\u010Dastnick\u00FDch submodul\u016F osazen\u00FDch obvody Silicon Labs Si32xx. Tester se skl\u00E1d\u00E1 z \u0159\u00EDdic\u00EDho pr\u016Fmyslov\u00E9ho PC osazen\u00E9ho multifunk\u010Dn\u00ED m\u011B\u0159ic\u00ED kartou, sk\u0159\u00EDn\u011B s testovac\u00ED elektronikou, v\u00FDsuvn\u00E9 kl\u00E1vesnice a my\u0161i, LCD monitoru s kloubov\u00FDm zav\u011B\u0161en\u00EDm a z nosn\u00E9ho \u0161asi z hlin\u00EDkov\u00FDch profil\u016F. Celek je navr\u017Een tak, aby testy mohla prov\u00E1d\u011Bt obsluha bez odborn\u00FDch znalost\u00ED. Cel\u00FD test a jeho v\u00FDsledek je obsluze zobrazen na LCD monitoru. Tester na ka\u017Ed\u00E9m submodulu prov\u00E1d\u00ED tyto testy: -Test ID obvodu. -Test registr\u016F a RAM. -M\u011B\u0159en\u00ED nap\u011Bt\u00ED a proud\u016F na telefonn\u00ED lince v r\u016Fzn\u00FDch stavech. -M\u011B\u0159en\u00ED parametr\u016F vyzv\u00E1n\u011Bn\u00ED. -Test volby. -Test smy\u010Dek DLM-PCM, DLM-hybrid a DLM-codec. -M\u011B\u0159en\u00ED frekven\u010Dn\u00ED p\u0159enosov\u00E9 chrarakteristiky."@cs . . "RIV/00216305:26220/09:PR24121" . "Tester of subscriber submodules based on Si32xx integrated circuits"@en . "26220" . . . . . . "Tester Si M01 je navr\u017Een speci\u00E1ln\u011B pro testov\u00E1n\u00ED \u00FA\u010Dastnick\u00FDch submodul\u016F osazen\u00FDch obvody Silicon Labs Si32xx. Tester se skl\u00E1d\u00E1 z \u0159\u00EDdic\u00EDho pr\u016Fmyslov\u00E9ho PC osazen\u00E9ho multifunk\u010Dn\u00ED m\u011B\u0159ic\u00ED kartou, sk\u0159\u00EDn\u011B s testovac\u00ED elektronikou, v\u00FDsuvn\u00E9 kl\u00E1vesnice a my\u0161i, LCD monitoru s kloubov\u00FDm zav\u011B\u0161en\u00EDm a z nosn\u00E9ho \u0161asi z hlin\u00EDkov\u00FDch profil\u016F. Celek je navr\u017Een tak, aby testy mohla prov\u00E1d\u011Bt obsluha bez odborn\u00FDch znalost\u00ED. Cel\u00FD test a jeho v\u00FDsledek je obsluze zobrazen na LCD monitoru. Tester na ka\u017Ed\u00E9m submodulu prov\u00E1d\u00ED tyto testy: -Test ID obvodu. -Test registr\u016F a RAM. -M\u011B\u0159en\u00ED nap\u011Bt\u00ED a proud\u016F na telefonn\u00ED lince v r\u016Fzn\u00FDch stavech. -M\u011B\u0159en\u00ED parametr\u016F vyzv\u00E1n\u011Bn\u00ED. -Test volby. -Test smy\u010Dek DLM-PCM, DLM-hybrid a DLM-codec. -M\u011B\u0159en\u00ED frekven\u010Dn\u00ED p\u0159enosov\u00E9 chrarakteristiky." . "Si M01 tester is specifically designed for testing of subscriber submodules based on Silicon Labs Si32xx line of integrated circuits. The tester is comprised of industrial PC with multifunction data acquisition card, block with auxiliary test electronics, rack-mount keyboard and mouse, LCD monitor with rotary mount and aluminium profile chasis which holds all the components together. The entire tester is designed so it can be operated by unskilled labour. Progress and result of testing is displayed on the LCD monitor. These tests are performed on each submodule: -ID checking. -Internal registers and RAM verification. -Measurement of telephone line voltages and currents. -Measurement of ringing parameters. -Dialing test. -Test of signal loops DLM-PCM, DLM-hybrid and DLM-codec. -Measurement of frequency transfer function."@en . "Tester \u00FA\u010Dastnick\u00FDch submodul\u016F zalo\u017Een\u00FDch na obvodech Si32xx"@cs . .