"6"^^ . "EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS" . . "26220" . . . "Yagi, Shuichi" . "Traps appearing both in the AlGaN/GaN and AlGaAs/GaAs heterostructures are assigned by the low frequency noise measurements. Current collapse has been monitored throughout the unpassivated and SiN-passivation processes of the AlGaN/GaN heterostructures: the noise level of E1 (47 meV) trap decreased by 10 dBA/?Hz by the SiN passivation process together with the current collapse in IV curves, while E2 (131 meV) and E3 (235 meV) levels became apparent after SiN passivation. The commercially available AlGaAs/GaAs LED heads for the page and FAX printers are found to have several deep levels introduced during the contact formation processes." . "366755" . . "Neuveden" . "1"^^ . . "GaN, HEMT, 1/f noise"@en . . . "[9C8FEC9DED64]" . "Neuveden" . "Traps appearing both in the AlGaN/GaN and AlGaAs/GaAs heterostructures are assigned by the low frequency noise measurements. Current collapse has been monitored throughout the unpassivated and SiN-passivation processes of the AlGaN/GaN heterostructures: the noise level of E1 (47 meV) trap decreased by 10 dBA/?Hz by the SiN passivation process together with the current collapse in IV curves, while E2 (131 meV) and E3 (235 meV) levels became apparent after SiN passivation. The commercially available AlGaAs/GaAs LED heads for the page and FAX printers are found to have several deep levels introduced during the contact formation processes."@en . "RIV/00216305:26220/08:PU78578!RIV11-MSM-26220___" . "978-80-214-3717-3" . "2008-09-10+02:00"^^ . . "RIV/00216305:26220/08:PU78578" . . . "Matsui, Toshiaki" . "Tanuma, Nobuhisa" . "EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS"@en . . . "Z(MSM0021630503)" . . "EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS" . . . "EVALUATION OF AlGaN/GaN AND AlGaAs/GaAs HETERO-STRUCTURE DEEP LEVELS BY LOW FREQUENCY NOISE MEASUREMENTS"@en . "EDS 08" . "Okumura, Hajime" . "6"^^ . "\u0160ikula, Josef" . . "Tacano, Munecazu" . "Brno" .