"The contribution is focused on determination of a temperature inside PN junction defect regions. These defect regions are called microplasmas. The microplasma is specified like region with a lower strong-field avalanche ionization breakdown voltage than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junction at certain voltage. These local avalanche breakdowns may exhibit like a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and random pulse origin time points. During the measurement of the microplasma noise was observed a relation between two-states current impulse noise and a temperature of a PN junction defect region. The main goal of this article is a determination of temperature behavior inside the microplasma region depends on a current impulse noise time behavior." . . . . "4"^^ . "Budapest, Hungary" . "4"^^ . . . "Behavior of Temperature Inside PN Junction During Microplasma Switching" . . . "Behavior of Temperature Inside PN Junction During Microplasma Switching"@en . "26220" . "The contribution is focused on determination of a temperature inside PN junction defect regions. These defect regions are called microplasmas. The microplasma is specified like region with a lower strong-field avalanche ionization breakdown voltage than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junction at certain voltage. These local avalanche breakdowns may exhibit like a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and random pulse origin time points. During the measurement of the microplasma noise was observed a relation between two-states current impulse noise and a temperature of a PN junction defect region. The main goal of this article is a determination of temperature behavior inside the microplasma region depends on a current impulse noise time behavior."@en . . "Koktav\u00FD, Pavel" . . "P(GA102/06/1551), Z(MSM0021630503)" . "Andreev, Alexey" . . . "[34EE6485F7D5]" . "Holcman, Vladim\u00EDr" . "978-963-06-4915-5" . "RIV/00216305:26220/08:PU76446" . . "microplasma noise, PN junction, defect, diode, avalanche breakdown"@en . "357737" . . "Behavior of Temperature Inside PN Junction During Microplasma Switching" . "2008-05-07+02:00"^^ . . . . "RIV/00216305:26220/08:PU76446!RIV10-MSM-26220___" . . . . "Andreev, Alexey" . . "Zsolt Illyefalvi-Vitez" . "Reliability and Life-time Prediction" . "Behavior of Temperature Inside PN Junction During Microplasma Switching"@en . "Budapest" . . "4"^^ . "Ra\u0161ka, Michal" . .