"This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells." . . "Study of solar cells defects via noise measurement" . "This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells."@en . "P(GA102/06/1551), Z(MSM0021630503)" . "Koktav\u00FD, Pavel" . . "Mack\u016F, Robert" . . . . "2"^^ . . . . . . "978-963-06-4915-5" . "Study of solar cells defects via noise measurement"@en . "2"^^ . . "RIV/00216305:26220/08:PU74267" . "000272337900021" . "Budapest" . . . . "RIV/00216305:26220/08:PU74267!RIV10-MSM-26220___" . . "Mesterprint Printinghouse Ltd." . . . "[204C39F831E9]" . "Hungary, Budapest" . "398167" . . "2008-05-07+02:00"^^ . "Microplasma noise, A-type noise, Impulse duration, Impulse separation, PN junction, Solar cell"@en . "Study of solar cells defects via noise measurement"@en . . "26220" . . . "Study of solar cells defects via noise measurement" . . "Reliability and Life-time Prediction Conference Proceedings" . "5"^^ .