. . "Mack\u016F, Robert" . "3"^^ . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . "Electroluminescence, luminescence centers, nanocrystal, phosphors, photoluminescence, scanning near-field optical microscopy, ZnS:Mn"@en . . "000253628500017" . "[A2990565AD28]" . . . "2" . "382010" . . . "Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices" . "RIV/00216305:26220/08:PU72510" . . "Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices"@en . . "Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices"@en . "P(GA102/08/1474), Z(MSM0021630503)" . . "Grmela, Lubom\u00EDr" . . "229" . "26220" . . . . . . "0022-2720" . "6"^^ . "A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well." . . . . "RIV/00216305:26220/08:PU72510!RIV10-MSM-26220___" . . "Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices" . . . "A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well."@en . "3"^^ . "Journal of Microscopy" . "Tom\u00E1nek, Pavel" . .