"6"^^ . "Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture"@en . . . "Chobola, Zden\u011Bk" . "4"^^ . "Jur\u00E1nkov\u00E1, Vlasta" . "This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3 and G5. The study is based on ane analysis of the device transport and noisse characteristics. This analysis shows that better quality (lower voltage noise spectral density) is exhibited by the structrue of the groups of G3 specimens, this junciton (of a thickness of about 1 um) is etched away from the rear side." . "Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture"@en . "2007-11-28+01:00"^^ . "4"^^ . "RIV/00216305:26220/07:PU71139" . "Ba\u0159inka, Radim" . "P(GP102/05/P199), Z(MSM0021630516)" . "51-56" . "RIV/00216305:26220/07:PU71139!RIV08-GA0-26220___" . "New trends in physics NTF 2007" . . . "437436" . "\u0160umov\u00E1 spektroskopie jako diagnostick\u00FD n\u00E1rtroj pro nedestruktivn\u00ED testovn\u00E1n\u00ED nov\u00E9ho typu sol\u00E1rn\u00EDho \u010Dl\u00E1nku s obou-stranou texturou."@cs . . "Brno" . . . . . "Brno" . . . "Ing. Zden\u011Bk Novotn\u00FD CSc." . . . . "Van\u011Bk, Ji\u0159\u00ED" . . "[541603AAB5FC]" . "26220" . "noise spectroscopy, solar cell"@en . "Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture" . "viz. originalni popis."@cs . . "\u0160umov\u00E1 spektroskopie jako diagnostick\u00FD n\u00E1rtroj pro nedestruktivn\u00ED testovn\u00E1n\u00ED nov\u00E9ho typu sol\u00E1rn\u00EDho \u010Dl\u00E1nku s obou-stranou texturou."@cs . . . . "Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture" . "This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3 and G5. The study is based on ane analysis of the device transport and noisse characteristics. This analysis shows that better quality (lower voltage noise spectral density) is exhibited by the structrue of the groups of G3 specimens, this junciton (of a thickness of about 1 um) is etched away from the rear side."@en . . "978-80-7355-078-3" .