. . "4"^^ . "RIV/00216305:26220/07:PU70252!RIV08-GA0-26220___" . "RIV/00216305:26220/07:PU70252" . . "Ing. Zden\u011Bk Novotn\u00FD CSc." . "B-type noise, Microplasma noise, Statistical characteristics"@en . "2007-11-15+01:00"^^ . . . "New Trends in Physics" . . "Anal\u00FDza proudov\u00E9ho \u0161umu velk\u00FDch PN p\u0159echod\u016F"@cs . "Brno" . "978-80-7355-078-3" . "Brno" . . . . . . "Study of Noise Current in Large Area PN Junctions Measurement"@en . "453286" . . "126-129" . "Study of Noise Current in Large Area PN Junctions Measurement" . . . "[D4595D51B98A]" . . "Study of Noise Current in Large Area PN Junctions Measurement" . . "Sadovsk\u00FD, Petr" . "Tato pr\u00E1ce se zab\u00FDv\u00E1 anal\u00FDzou proudov\u00E9ho \u0161umu v PN p\u0159echodech zapojen\u00FDch v z\u00E1v\u011Brn\u00E9m sm\u011Bru."@cs . . "Anal\u00FDza proudov\u00E9ho \u0161umu velk\u00FDch PN p\u0159echod\u016F"@cs . "This work deals with study of noise current in reverse biased PN junctions. When a high electric field is applied to a PN junction with some technological imperfections it produces tiny areas which could lead to deterioration in quality or destruction of the PN junction. Two fundamental types of the current noise have been detected during our noise waveform studies. The A-type noise is formed by a train of random-duration, random-time-separation, rectangular current impulses provided that a constant-voltage power supply is used. This type of noise is encountered mainly in small-area junction devices. The B-type noise is playing a predominate role in devices whose junction area exceeds 1 cm2, e. g. large area solar cells."@en . "Koktav\u00FD, Pavel" . . . . "P(GA102/06/1551), P(GA102/07/0113), Z(MSM0021630503)" . "26220" . "2"^^ . "Study of Noise Current in Large Area PN Junctions Measurement"@en . "2"^^ . "This work deals with study of noise current in reverse biased PN junctions. When a high electric field is applied to a PN junction with some technological imperfections it produces tiny areas which could lead to deterioration in quality or destruction of the PN junction. Two fundamental types of the current noise have been detected during our noise waveform studies. The A-type noise is formed by a train of random-duration, random-time-separation, rectangular current impulses provided that a constant-voltage power supply is used. This type of noise is encountered mainly in small-area junction devices. The B-type noise is playing a predominate role in devices whose junction area exceeds 1 cm2, e. g. large area solar cells." .