. "Ing. Zden\u011Bk Novotn\u00FD CSc." . . . "[2C55F7ADA86B]" . . "Device for statistical characteristics of microplasma noise measurment"@en . . . "New trends in physics" . "2007-11-15+01:00"^^ . . . "2"^^ . "N\u00E1hodn\u00E9 dvojhladinov\u00E9 proudov\u00E9 impulzy m\u016F\u017Eeme sledovat u elektronick\u00FDch sou\u010D\u00E1stek, kter\u00E9 vyu\u017E\u00EDvaj\u00ED z\u00E1v\u011Brn\u011B polarizovan\u00FD PN p\u0159echod. Tyto impulzy jsou obvykle obd\u00E9ln\u00EDkov\u00E9 a jsou charakteristick\u00E9 konstantn\u00ED amplitudou, n\u00E1hodnou dobou trv\u00E1n\u00ED a n\u00E1hodn\u00FDm okam\u017Eikem vzniku. Z experiment\u00E1ln\u011B z\u00EDskan\u00FDch v\u00FDsledk\u016F statistick\u00FDch charakteristik byl z\u00EDsk\u00E1n model stochatistick\u00E9ho genera\u010Dn\u011B-rekombina\u010Dn\u00EDho procesu kter\u00FDm m\u016F\u017Eeme popsat dvojhladinov\u00FD impulzn\u00ED \u0161um. V tomto \u010Dl\u00E1nku je popisov\u00E1no za\u0159\u00EDzen\u00ED pro m\u011B\u0159en\u00ED statistick\u00FDch charakteristik v \u0161irok\u00E9m \u010Dasov\u00E9m rozsahu. Z\u00EDskan\u00E9 z\u00E1v\u011Bry m\u016F\u017Eou b\u00FDt pou\u017Eity pro nedestruktivn\u00ED hodnocen\u00ED kvality PN p\u0159echodu."@cs . . "Device for statistical characteristics of microplasma noise measurment" . . . "2"^^ . "Za\u0159\u00EDzen\u00ED pro m\u011B\u0159en\u00ED statistick\u00FDch charakteristik mikroplazmatick\u00E9ho \u0161umu"@cs . . . . "978-80-7355-078-3" . . "Microplasma noise, Statistical characteristics, A-type noise, Impulse duration, Impulse separation"@en . "P(GA102/06/1551), Z(MSM0021630503)" . "90-93" . . "416912" . "RIV/00216305:26220/07:PU70073" . "Mack\u016F, Robert" . . "26220" . "RIV/00216305:26220/07:PU70073!RIV08-GA0-26220___" . "Device for statistical characteristics of microplasma noise measurment" . . "Brno" . "4"^^ . "Brno" . "Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment."@en . . . "Koktav\u00FD, Pavel" . "Za\u0159\u00EDzen\u00ED pro m\u011B\u0159en\u00ED statistick\u00FDch charakteristik mikroplazmatick\u00E9ho \u0161umu"@cs . "Device for statistical characteristics of microplasma noise measurment"@en . . "Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment." .