. "4"^^ . . "Z\u00E1pado\u010Desk\u00E1 univerzita v Plzni" . . . "Metodika m\u011B\u0159en\u00ED \u0161umu sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F"@cs . "Microplasma noise, Impulse current, VA characteristics, Impulse duration, Impulse separation, Statistical characteristics, PN junction"@en . "Koktav\u00FD, Pavel" . "RIV/00216305:26220/07:PU70070" . . "45-48" . . . . "One way how we can get information about PN junction quality in non-destructive diagnostics is microplasma noise observation. The microplasma noise typically occurs in semiconductor devices with a PN junction e.g. silicon diodes, LED diodes (GaAsP) and solar cells. Usage of the microplasma noise measurement for studding the solar cells is shown in this paper. The noise current dependence of the reverse voltage and relationship with VA characteristics may be observed. One of the parameter in view of the microplasma noise is statistical characteristics of impulse time duration and impulse time separation. Coefficients g and r characterizing two-state stochastic generation-recombination type process may be obtained from the statistical characteristics."@en . "Jednou z cest jak m\u016F\u017Eeme z\u00EDskat informace o kvalit\u011B PN p\u0159echodu nedestruktivn\u00ED metodou je pozorov\u00E1n\u00ED mikroplazmatick\u00E9ho \u0161umu. Mikroplazmatick\u00FD \u0161um se typicky vyskytuje v polovodi\u010Dov\u00FDch sou\u010D\u00E1stk\u00E1ch s PN p\u0159echody jako nap\u0159\u00EDklad diody, LED diody a sol\u00E1rn\u00ED \u010Dl\u00E1nky. Pou\u017Eit\u00ED m\u011B\u0159en\u00ED mikroplazmatick\u00E9ho \u0161umu pro studium sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F je uk\u00E1z\u00E1no v tom to \u010Dl\u00E1nku. Budou popisov\u00E1ny z\u00E1vislosti \u0161umov\u00E9ho proudu na z\u00E1v\u011Brn\u00E9m nap\u011Bt\u00ED a souvislosti s VA charakteristikami. Dal\u0161\u00EDm sledovan\u00FDm parametrem mikroplazmatick\u00E9ho \u0161umu jsou statistick\u00E9 charakteristiky trv\u00E1n\u00ED impulz\u016F a jejich vz\u00E1jemn\u00E9ho rozestupu. Z t\u011Bchto charakteristik m\u016F\u017Eeme n\u00E1sledn\u011B z\u00EDskat sou\u010Dinitele g a r popisuj\u00EDc\u00ED dvoustavov\u00FD genera\u010Dn\u011B rekombina\u010Dn\u00ED proces."@cs . . . "Solar cell noise measurement methodology"@en . . . . "Metodika m\u011B\u0159en\u00ED \u0161umu sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F" . . "[DE8F3817E31F]" . . "2007-10-31+01:00"^^ . "Elektronika a informatika 2007" . . "Solar cell noise measurement methodology"@en . "Jednou z cest jak m\u016F\u017Eeme z\u00EDskat informace o kvalit\u011B PN p\u0159echodu nedestruktivn\u00ED metodou je pozorov\u00E1n\u00ED mikroplazmatick\u00E9ho \u0161umu. Mikroplazmatick\u00FD \u0161um se typicky vyskytuje v polovodi\u010Dov\u00FDch sou\u010D\u00E1stk\u00E1ch s PN p\u0159echody jako nap\u0159\u00EDklad diody, LED diody a sol\u00E1rn\u00ED \u010Dl\u00E1nky. Pou\u017Eit\u00ED m\u011B\u0159en\u00ED mikroplazmatick\u00E9ho \u0161umu pro studium sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F je uk\u00E1z\u00E1no v tom to \u010Dl\u00E1nku. Budou popisov\u00E1ny z\u00E1vislosti \u0161umov\u00E9ho proudu na z\u00E1v\u011Brn\u00E9m nap\u011Bt\u00ED a souvislosti s VA charakteristikami. Dal\u0161\u00EDm sledovan\u00FDm parametrem mikroplazmatick\u00E9ho \u0161umu jsou statistick\u00E9 charakteristiky trv\u00E1n\u00ED impulz\u016F a jejich vz\u00E1jemn\u00E9ho rozestupu. Z t\u011Bchto charakteristik m\u016F\u017Eeme n\u00E1sledn\u011B z\u00EDskat sou\u010Dinitele g a r popisuj\u00EDc\u00ED dvoustavov\u00FD genera\u010Dn\u011B rekombina\u010Dn\u00ED proces." . "978-80-7043-572-4" . "Mack\u016F, Robert" . "\u0160karvada, Pavel" . "26220" . . "Metodika m\u011B\u0159en\u00ED \u0161umu sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F" . "3"^^ . "433290" . "RIV/00216305:26220/07:PU70070!RIV08-GA0-26220___" . . "Plze\u0148" . . . "Metodika m\u011B\u0159en\u00ED \u0161umu sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F"@cs . "3"^^ . "P(GA102/06/1551), Z(MSM0021630503)" . . . . . "Ne\u010Dtiny" .