. . . . . "Proc. ICNF 2007 AIP Conf. Proc. Vol. 922" . "978-0-7354-0432-8" . . "Pavelka, Jan" . . "26220" . "2"^^ . "Tokio" . "3"^^ . "AIP" . "Non-Poisson Process in RTS-like noise"@en . . "RTS noise was measured in wide range of semiconductor devices, comprising Si MOSFETs and GaN/AlGaN and InGaAs/InAlAs heterostructures. Statistical analysis of RTS noise in InGaAs sample revealed considerable correlation of subsequent pulse duration."@en . . . "4"^^ . "Ne-Poissonovsk\u00FD proces v \u0161umu typu RTS"@cs . . "2007-09-09+02:00"^^ . "RIV/00216305:26220/07:PU69172" . . "Non-Poisson Process in RTS-like noise" . . . . "Non-Poisson Process in RTS-like noise"@en . "RIV/00216305:26220/07:PU69172!RIV08-GA0-26220___" . . "Tokyo" . "437552" . . . . "P(GA102/05/2095), Z(MSM0021630503)" . "Tacano, Munecazu" . "RTS noise, 1/f noise, MOSFET, HFET, InGaAs, GaN"@en . "\u0160ikula, Josef" . "RTS \u0161um byl m\u011B\u0159en v r\u016Fzn\u00FDch polovodi\u010Dov\u00FDch sou\u010D\u00E1stk\u00E1ch - Si MOSFET a GaN/AlGaN a InGaAs/InAlAs heterostruktur\u00E1ch. Statistick\u00E1 anal\u00FDza \u0161umu RTS v p\u0159\u00EDpad\u011B InGaAs vzorku prok\u00E1zala korelaci d\u00E9lek sousedn\u00EDch puls\u016F."@cs . . . . "Ne-Poissonovsk\u00FD proces v \u0161umu typu RTS"@cs . "Non-Poisson Process in RTS-like noise" . "111-114" . "RTS noise was measured in wide range of semiconductor devices, comprising Si MOSFETs and GaN/AlGaN and InGaAs/InAlAs heterostructures. Statistical analysis of RTS noise in InGaAs sample revealed considerable correlation of subsequent pulse duration." . "[A6F7596EF75E]" .