. . "RIV/00216305:26220/07:PU67631!RIV10-MSM-26220___" . "CoPhys 2006" . "Br\u00FCstlov\u00E1, Jitka" . . "Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices" . . . "26220" . "Univerzita Kon\u0161tant\u00EDna Filozofa v Nitre" . "Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices"@en . "The advancement of ACTFEL technology is dependent on the development of new processing techniques and new phosphor materials. The short description of material requirements for the constituent layers of ACTFEL devices and of luminescent impurities commonly used in ACTFEL devices and their local electroluminescent measurement is presented."@en . . . "[C4B4BB2FC6DE]" . . . . "Dobis, Pavel" . . "Tom\u00E1nek, Pavel" . . . "11"^^ . . "4"^^ . . "Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices"@en . "Nitra" . "Nitra" . . "P(GA102/07/0113), Z(MSM0021630503)" . "Ahmed, Mustafa M. Abdalla" . "4"^^ . . "RIV/00216305:26220/07:PU67631" . . "431276" . . . "The advancement of ACTFEL technology is dependent on the development of new processing techniques and new phosphor materials. The short description of material requirements for the constituent layers of ACTFEL devices and of luminescent impurities commonly used in ACTFEL devices and their local electroluminescent measurement is presented." . . "ZnS:Mn phosphor, alternating-current thin-film electroluminescent, electroluminescence, photoluminescence, Scanning near-field optical microscopy"@en . "978-80-8094-084-3" . "Ahmed, Mustafa M. Abdalla" . . "2006-12-05+01:00"^^ . "Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices" .