. "Test-chip for non-linear capacitors characterization" . "Test-chip for non-linear capacitors characterization"@en . . "Testovac\u00ED \u010Dip pro charakterizaci neline\u00E1rn\u00EDch kondenz\u00E1tor\u016F"@cs . "P(GD102/03/H105)" . "The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed." . . . . . . "EDS '05 IMAPS CS International Conference Proceedings" . . "2005-09-15+02:00"^^ . "2"^^ . "RIV/00216305:26220/05:PU51156" . "Test-chip for non-linear capacitors characterization"@en . . "26220" . "2"^^ . . "Test-chip for non-linear capacitors characterization" . . "6"^^ . "Brno" . "Ing. Zden\u011Bk Novotn\u00FD CSc." . . "Sutor\u00FD, Tom\u00E1\u0161" . "Brno" . . "P\u0159\u00EDsp\u011Bvek pojedn\u00E1v\u00E1 o charakterizaci a linearizaci neline\u00E1rn\u00EDch MOS kondenz\u00E1tor\u016F. Jsou prezentov\u00E1ny z\u00E1kladn\u00ED principy kompenzace. Nov\u00E1 m\u011B\u0159\u00EDc\u00ED metoda pro charakterizaci je implementov\u00E1na na testovac\u00EDm \u010Dipu."@cs . . "RIV/00216305:26220/05:PU51156!RIV06-GA0-26220___" . "80-214-2990-9" . "Testovac\u00ED \u010Dip pro charakterizaci neline\u00E1rn\u00EDch kondenz\u00E1tor\u016F"@cs . "546466" . . "MOS capacitors, characterization, test-chip, linearization, non-linear"@en . "The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed."@en . "396-401" . . "[4BB2559F3486]" . . "Kolka, Zden\u011Bk" . . .