"\u010Cast\u00E1-P\u00EDla" . "[233D97976F20]" . . . . "Tom\u00E1nek, Pavel" . "waveguide, optical properties, local probe measurement"@en . "80-227-2073-9" . "Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per"@en . "RIV/00216305:26220/04:PU43648" . "571689" . "Slovensk\u00E1 technick\u00E1 univerzita v Bratislave" . . "Local characterization of optical waveguide structure using Scanning near-field optical microscopy"@en . "Applied physics on condensed matter APCOM \u2013 2004" . "Lok\u00E1ln\u00ED charakterizace struktur optick\u00FDch vlnovod\u016F pomoc\u00ED rastrovac\u00ED optick\u00E9 mikroskopie v bl\u00EDzk\u00E9m poli"@cs . . . "P(ME 544), P(OC 523.40), Z(MSM 262200022)" . . . . . . "4"^^ . "RIV/00216305:26220/04:PU43648!RIV/2005/MSM/262205/N" . . . "Bratislava" . "Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per" . . . . "Grmela, Lubom\u00EDr" . "3"^^ . "Local characterization of optical waveguide structure using Scanning near-field optical microscopy" . "Rastrovac\u00ED optick\u00E1 mikroskopie v bl\u00EDzk\u00E9m poli(SNOM) je mo\u017En\u00E9 pou\u017E\u00EDt k m\u011B\u0159en\u00ED vnit\u0159n\u00EDho rozlo\u017Een\u00ED vid\u016F a lok\u00E1ln\u00EDch vlastnost\u00ED vlnovodu. Mal\u00E9 fluktuace charakteristik materi\u00E1lu mohou ovlivnit vlastn\u00ED m\u011B\u0159en\u00ED. Lok\u00E1ln\u00ED sondov\u00E9 m\u011B\u0159en\u00ED umo\u017En\u00ED vyhnout se tomutoprobl\u00E9mu a experiment\u00E1ln\u011B ov\u011B\u0159it perturbace zaveden\u00E9 p\u0159i m\u011B\u0159en\u00ED pomoc\u00ED sondy SNOM."@cs . "2004-06-16+02:00"^^ . "Otev\u0159elov\u00E1, Dana" . . "Lok\u00E1ln\u00ED charakterizace struktur optick\u00FDch vlnovod\u016F pomoc\u00ED rastrovac\u00ED optick\u00E9 mikroskopie v bl\u00EDzk\u00E9m poli"@cs . "26220" . "183-186" . . "Local characterization of optical waveguide structure using Scanning near-field optical microscopy" . . . . "3"^^ . "Local characterization of optical waveguide structure using Scanning near-field optical microscopy"@en .