"Generalized Cross Validation with Bayes Approach for Image Denoising" . . . . "V, Z(MSM 262200011), Z(MSM 262200022)" . "RIV/00216305:26220/04:PU41449!RIV11-MSM-26220___" . "This paper describes a new method for suppression of noise in images based on wavelet transform. Classic de-noising methods based on the wavelet transform are based on binary decision. Wavelet coefficients below threshold are replaced by zero, and kept (hard-threshold) or shrinked (soft-threshold) with absolute value above the threshold. The proposed method relies on two criteria. The first criterion is based on estimation of optimal threshold without knowledge exact data using Generalized Cross Validation (GCV) technique. The second criterion employes Bayes approach to improve noise suppression in images." . . . "Generalized Cross Validation with Bayes Approach for Image Denoising"@en . . "Neuveden" . "565268" . . . . "26220" . "Praha" . "1"^^ . . . "Praha" . . . "1"^^ . . . "6"^^ . . . . . . "2004-05-20+02:00"^^ . "image processing, noise suppression, Markov Random Fields, applied probability, H\u0151lder regularity, random number, Generalized Cross Validation"@en . "This paper describes a new method for suppression of noise in images based on wavelet transform. Classic de-noising methods based on the wavelet transform are based on binary decision. Wavelet coefficients below threshold are replaced by zero, and kept (hard-threshold) or shrinked (soft-threshold) with absolute value above the threshold. The proposed method relies on two criteria. The first criterion is based on estimation of optimal threshold without knowledge exact data using Generalized Cross Validation (GCV) technique. The second criterion employes Bayes approach to improve noise suppression in images."@en . "Generalized Cross Validation with Bayes Approach for Image Denoising" . "RIV/00216305:26220/04:PU41449" . "Generalized Cross Validation with Bayes Approach for Image Denoising"@en . "\u010Cervinka, Tom\u00E1\u0161" . . "[4ECF50CF6096]" . . "8th International Student Conference on Electrical Engineering" .