. "near-field, electro-optical devices"@en . . "Bene\u0161ov\u00E1, Mark\u00E9ta" . "0"^^ . "4"^^ . . "26220" . "0"^^ . . "Tom\u00E1nek, Pavel" . . "280-283" . . "RIV/00216305:26220/03:PU38399!RIV/2004/MSM/262204/N" . . . "4"^^ . "2003-05-06+02:00"^^ . . "RIV/00216305:26220/03:PU38399" . "602408" . . . "In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented." . . . "[2F74D56B6153]" . . . . "80-214-2388-8" . "4"^^ . "Majzner, Ji\u0159\u00ED" . "Brno" . "Critical role of near-field optics in the characterization of electro-optical devices"@en . "Brno" . . "Grmela, Lubom\u00EDr" . . "Radioelektronika 2003 Conference proceedings" . "Critical role of near-field optics in the characterization of electro-optical devices" . "MJ Servis Ltd." . . "P(ME 544), Z(MSM 262200022)" . "Critical role of near-field optics in the characterization of electro-optical devices" . "Critical role of near-field optics in the characterization of electro-optical devices"@en . . "In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented."@en .