. "Tom\u00E1nek, Pavel" . . "26220" . "P(ME 544), P(OC 523.40), Z(MSM 262200022)" . "[BA95AA15F46A]" . "Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices" . . "287-290" . . . . . . "Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices"@en . . "Dobis, Pavel" . "RIV/00216305:26220/03:PU37672" . "4"^^ . "0"^^ . . "0"^^ . . . "4"^^ . . "Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS"@en . "Br\u00FCstlov\u00E1, Jitka" . "Brno" . . . "Brno" . . . . "Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp),, and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices." . . "605706" . . "Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices" . "Ing. Zden\u011Bk Novotn\u00FD CSc." . "RIV/00216305:26220/03:PU37672!RIV/2004/MSM/262204/N" . "80-214-2452-4" . . "Grmela, Lubom\u00EDr" . "2003-09-09+02:00"^^ . "Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp),, and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices."@en . "The 10th EDS 2003 Electronic Devices and Systems Conference" . . "Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices"@en . . "4"^^ . .