"601729" . . "Hork\u00FD, Drahom\u00EDr" . . . "26220" . . "Comparison of imaging with SE ionisation and BSE scintillation detector in ESEM"@en . "2003-06-01+02:00"^^ . "Pula" . . "Pula" . . "RIV/00216305:26220/03:PU36423" . . "Comparison, SE, ionisation, BSE, scintillation, ESEM"@en . . . "P(GA102/01/1271), P(GA102/05/0886), Z(MSM 262200010)" . "4"^^ . "Comparison of imaging with SE ionisation and BSE scintillation detector in ESEM" . . "Comparison of imaging with SE ionisation and BSE scintillation detector in ESEM"@en . . "Environmental scanning electron microscopy (ESEM) or low-vacuum scanning electron microscopy (LV SEM) enables the visualisation of samples in a gaseous environment at the pressure of the specimen chamber from 1 Pa to over 1000 Pa. Detection of signal electrons, namely secondary electrons (SE) cannot be realised in a gaseous environment of the specimen chamber in the same way as for the high vacuum SEM, because high voltage of the Everhart-Thornley detector is not compatible with the conductance of the llow vacuum environment [1]. For this reason, gaseous ions which are ionised by SE from the specimen are used for the detection in ESEM. For the detection of the backscattered electrons (BSES), conventional scintillation detector is the best to use."@en . . "487-488" . . "2"^^ . . . "2"^^ . . . "RIV/00216305:26220/03:PU36423!RIV06-GA0-26220___" . "Srovn\u00E1n\u00ED obrazu z\u00EDskan\u00E9ho pomoc\u00ED ioniza\u010Dn\u00EDho SE detektoru a scintila\u010Dn\u00EDho BSE detektoru v EREM."@cs . . "[807AD13E3D6B]" . "Autrata, Rudolf" . . . "Proceedings 6th Multinational Congress on Microscopy" . "Neuveden" . . "Comparison of imaging with SE ionisation and BSE scintillation detector in ESEM" . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop (EREM), nebo n\u00EDzkovakuov\u00FD rastrovac\u00ED elektronov\u00FD mikroskop (LV REM) dovoluj\u00ED pozorovat vzorky v prost\u0159ed\u00ED plynu p\u0159i tlac\u00EDch od 1Pa a\u017E do tlaku kolem 1000Pa. Detekce sign\u00E1lov\u00FDch elektron\u016F v EREM, zejm\u00E9na sekund\u00E1rn\u00EDch elektron\u016F (SE), nem\u016F\u017Ee b\u00FDt realizov\u00E1na stejn\u00FDm zp\u016Fsobem jako je tomu v SEM, proto\u017Ee vysok\u00E9 nap\u011Bt\u00ED Everhart-Thornley detektoru by v prost\u0159ed\u00ED vysok\u00E9ho tlaku zp\u016Fsoboval\u016F v\u00FDboje \u010Di pr\u016Frazy v plynu."@cs . "Environmental scanning electron microscopy (ESEM) or low-vacuum scanning electron microscopy (LV SEM) enables the visualisation of samples in a gaseous environment at the pressure of the specimen chamber from 1 Pa to over 1000 Pa. Detection of signal electrons, namely secondary electrons (SE) cannot be realised in a gaseous environment of the specimen chamber in the same way as for the high vacuum SEM, because high voltage of the Everhart-Thornley detector is not compatible with the conductance of the llow vacuum environment [1]. For this reason, gaseous ions which are ionised by SE from the specimen are used for the detection in ESEM. For the detection of the backscattered electrons (BSES), conventional scintillation detector is the best to use." . "Ned\u011Bla, Vil\u00E9m" . "Schauer, Petr" . . "Srovn\u00E1n\u00ED obrazu z\u00EDskan\u00E9ho pomoc\u00ED ioniza\u010Dn\u00EDho SE detektoru a scintila\u010Dn\u00EDho BSE detektoru v EREM."@cs . .