"A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences."@en . . "Z(MSM 262200022)" . "Proceeding of CARTS 2002 - 16th European Passive Components Conference" . "32-36" . . "A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences." . . "2002-10-14+02:00"^^ . . . . . "Pavelka, Jan" . "[43122E1BC9A2]" . "RIV/00216305:26220/02:PU30096!RIV/2003/MSM/262203/N" . . "Charge carrier transport and noise of niobium capacitors"@en . "Noise, niobium capacitor, spectral density"@en . "Zedn\u00ED\u010Dek, Tom\u00E1\u0161" . . . . "Charge carrier transport and noise of niobium capacitors" . . "Dobis, Pavel" . "SWINDON, England" . "3"^^ . "RIV/00216305:26220/02:PU30096" . "Charge carrier transport and noise of niobium capacitors"@en . . . "Port St. Laurent, Francie" . "26220" . "5"^^ . . "640708" . "Charge carrier transport and noise of niobium capacitors" . . "4"^^ . "0"^^ . "Electronic Components Institute Internationale, Ltd." . "\u0160ikula, Josef" . "0"^^ . . .