. "SPIE-The International Society for Optical Engineering" . "352-356" . "0"^^ . "5"^^ . "2"^^ . "0"^^ . . . "This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a %22modulation depth%22%22 of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4." . "26220" . "Z(MSM 262200011), Z(MSM 262200022)" . . "RIV/00216305:26220/02:PU29889!RIV/2003/MSM/262203/N" . "2"^^ . . . "semiconductor laser, laser chip, antireflection coating"@en . "Residual Reflectivity of Amplification Media for Extended-Cavity Laser"@en . . . "Novosibirsk" . . . "Residual Reflectivity of Amplification Media for Extended-Cavity Laser" . "[2A804FE73B1B]" . . "2002-09-09+02:00"^^ . . "Seveth International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life" . . "Residual Reflectivity of Amplification Media for Extended-Cavity Laser"@en . "This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a %22modulation depth%22%22 of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4."@en . "662207" . "Washington, USA" . "0-8194-4686-6" . . . "Residual Reflectivity of Amplification Media for Extended-Cavity Laser" . "R\u016F\u017Ei\u010Dka, Bohdan" . "Wilfert, Otakar" . . "RIV/00216305:26220/02:PU29889" . . .