"674786" . "P(ME 285)" . "Burst noise in thin amorphous films"@en . . "2001-11-15+01:00"^^ . "Burst noise in thin amorphous films" . "burst noise, Ta2O5 films, self-healing"@en . . "26220" . . "Pavelka, Jan" . "A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta-Ta2O5-MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. Correlation between leakage current and noise spectral density was evaluated."@en . "Brno" . "A low frequency noise and charge carriers transport mechanism analysis have been performed on Ta-Ta2O5-MnO2 heterostructures of various thickness to determine the current noise sources. The model of MIS structure can be used to give physical interpretation of VA characteristic both in normal and reverse modes. Correlation between leakage current and noise spectral density was evaluated." . "Brno" . . "Sborn\u00EDk p\u0159\u00EDsp\u011Bvk\u016F konference Nov\u00E9 trendy ve fyzice" . . . "Vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Brn\u011B. Fakulta elektrotechniky a informatiky. \u00DAstav fyziky" . . . . . "Burst noise in thin amorphous films" . "[56547815F037]" . . . . . "RIV/00216305:26220/01:PU23966" . "1"^^ . "0"^^ . "1"^^ . "RIV/00216305:26220/01:PU23966!RIV/2002/MSM/262202/N" . "105-110" . "6"^^ . "0"^^ . . . "Burst noise in thin amorphous films"@en . "80-214-1992-X" .