. . . . . "26220" . . . "Hashiguchi, Sumihisa" . "tantalum capacitor, MIS structure, leakage current"@en . "Components Technology Institute, Inc." . "Grmela, Lubom\u00EDr" . . "\u0160ikula, Josef" . "Tacano, Munecazu" . "2001-03-25+01:00"^^ . "P(ME 285)" . . "Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001" . "RIV/00216305:26220/01:PU21528!RIV/2002/MSM/262202/N" . "Huntsville, Alabama, USA" . "The Tantalum Capacitor as a MIS Structure in Reverse Mode" . . "Sedl\u00E1kov\u00E1, Vlasta" . "[005EAA0848D2]" . "4"^^ . . "0"^^ . . "0"^^ . "289-292" . . "The Tantalum Capacitor as a MIS Structure in Reverse Mode" . . "7"^^ . "698259" . "The charge carrier transport mechanisms in a tantalum capacitor are discussed and VA characteristics both in normal and reverse mode are explained on the basis of metal (Ta) - insulator (Ta2O5) - semiconductor (MnO2) MIS structure model. The leakage current temperature dependencies were measured to determine energy band parameters."@en . "0887-7491" . "The Tantalum Capacitor as a MIS Structure in Reverse Mode"@en . . "Pavelka, Jan" . . "RIV/00216305:26220/01:PU21528" . "5"^^ . . "The charge carrier transport mechanisms in a tantalum capacitor are discussed and VA characteristics both in normal and reverse mode are explained on the basis of metal (Ta) - insulator (Ta2O5) - semiconductor (MnO2) MIS structure model. The leakage current temperature dependencies were measured to determine energy band parameters." . . "St. Petersburg, Florida, USA" . . "The Tantalum Capacitor as a MIS Structure in Reverse Mode"@en . . "Hl\u00E1vka, Jan" .