. "Strain mapping by scanning low energy electron microscopy" . . . "Various techniques exist which are capable of studying the material microstructure, the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of polycrystalline materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition, is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to observe specimens at arbitrary landing energies of the primary electrons and to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channelling, mostly in the Mott scattering angular range. The material under investigation was a commercial purity copper prepared by equal channel angular pressing (ECAP) method using 8 passes, route Bc, namely in the as-pressed state and after annealing (in argon atmosphere, 180 C, 6 minutes" . . "Strain mapping by scanning low energy electron microscopy"@en . . . . . . "Mikmekov\u00E1, \u0160\u00E1rka" . "Strain mapping by scanning low energy electron microscopy" . "Pant\u011Blejev, Libor" . . "Various techniques exist which are capable of studying the material microstructure, the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of polycrystalline materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition, is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to observe specimens at arbitrary landing energies of the primary electrons and to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channelling, mostly in the Mott scattering angular range. The material under investigation was a commercial purity copper prepared by equal channel angular pressing (ECAP) method using 8 passes, route Bc, namely in the as-pressed state and after annealing (in argon atmosphere, 180 C, 6 minutes"@en . "S, Z(MSM0021630508)" . . . "RIV/00216305:26210/10:PU88560!RIV11-MSM-26210___" . . "Strain mapping by scanning low energy electron microscopy"@en . "[4E91FAB908B5]" . "Hovorka, Milo\u0161" . "7"^^ . . "Kou\u0159il, Miloslav" . "M\u00FCllerov\u00E1, Ilona" . "scanning low energy electron microscopy (SLEEM), contrast of crystal orientation, microscopic strain"@en . "RIV/00216305:26210/10:PU88560" . "290200" . . "26210" . "Frank, Lud\u011Bk" . . "4"^^ . . "Man, Ond\u0159ej" . . .