. "RIV/00216305:26210/08:PR23891" . "Scattermeter" . . "The apparatus enables us to measure also a very non-isotropic angular distribution of laser light scattered from arbitrary surfaces of solids. Adjustable positions of its individual mechanical parts enable us to measure the light scattering from a surface under study in various orientations of this surface relatively to an incident light beam (He-Ne laser operating in the wavelength of 632.8 nm or Ar-Kr laser adjustable in 12 wavelengths in visible spectral range) within a whole hemisphere above the given surface (the centre of the hemisphere is identical with the centre of the surface area irradiated) in a step given by a receiving angle of a photodiode (HAMAMATSU S1226-5BQ, the side of the active area of the photodiode is 2.4 mm, the distance from the photodiode to the centre of the irradiated surface area equals 250 mm, the non-zero spectral sensitivity lies in the range from 190 nm to 1000 nm) which is used as a detector of the scattered light intensity. The movement of adequate mechanical parts i"@en . "d\u00E9lka 250 mm, \u0161\u00ED\u0159ka 490 mm, v\u00FD\u0161ka 420 mm, hmotnost 8,5 kg. Funk\u010Dn\u00ED vzorek je vyu\u017E\u00EDv\u00E1n k \u0159e\u0161en\u00ED v\u011Bdeckov\u00FDzkumn\u00FDch \u00FAkol\u016F na pracovi\u0161ti \u0159e\u0161itele v Laborato\u0159i koheren\u010Dn\u00ED optiky, budova A2, m\u00EDstnost 218. http://physics.fme.vutbr.cz/u" . "5"^^ . "Za\u0159\u00EDzen\u00ED umo\u017E\u0148uje m\u011B\u0159it i v\u00FDrazn\u011B anizotropn\u00ED \u00FAhlov\u00E9 rozd\u011Blen\u00ED intenzity laserov\u00E9ho sv\u011Btla rozpt\u00FDlen\u00E9ho z libovoln\u00FDch povrch\u016F pevn\u00FDch t\u011Bles. Nastaviteln\u00E9 polohy jeho jednotliv\u00FDch mechanick\u00FDch \u010D\u00E1st\u00ED umo\u017E\u0148uj\u00ED m\u011B\u0159it rozptyl sv\u011Btla na studovan\u00E9m povrchu p\u0159i jeho r\u016Fzn\u00FDch orientac\u00EDch v\u016F\u010Di dopadaj\u00EDc\u00EDmu laserov\u00E9mu svazku (He-Ne laser pracuj\u00EDc\u00ED na vlnov\u00E9 d\u00E9lce 632,8 nm resp. Ar-Kr laser laditeln\u00FD na 12 vlnov\u00FDch d\u00E9lek vystupuj\u00EDc\u00EDho sv\u011Btla ve viditeln\u00E9 oblasti spektra) v cel\u00E9 hemisf\u00E9\u0159e nad dan\u00FDm povrchem (st\u0159ed hemisf\u00E9ry je toto\u017En\u00FD se st\u0159edem oz\u00E1\u0159en\u00E9 plochy povrchu) s krokem dan\u00FDm p\u0159ij\u00EDmac\u00EDm \u00FAhlem fotodiody (HAMAMATSU S1226-5BQ, d\u00E9lka hrany aktivn\u00ED plochy diody je rovna 2.4 mm, vzd\u00E1lenost dioda - st\u0159ed oz\u00E1\u0159en\u00E9 plochy povrchu je rovna 250 mm, nenulov\u00E1 spektr\u00E1ln\u00ED citlivost v rozsahu vlnov\u00FDch d\u00E9lek 190 nm a\u017E 1000 nm), kter\u00E1 je pou\u017Eita jako detektor intenzity rozpt\u00FDlen\u00E9ho sv\u011Btla. Pohyb p\u0159\u00EDslu\u0161n\u00FDch mechanick\u00FDch \u010D\u00E1st\u00ED SM"@cs . "Apparatus for measurement of laser light scattering from surfaces of solids"@en . . . . "P(FT-TA3/142), Z(MSM0021630518)" . "5"^^ . . "Za\u0159\u00EDzen\u00ED umo\u017E\u0148uje m\u011B\u0159it i v\u00FDrazn\u011B anizotropn\u00ED \u00FAhlov\u00E9 rozd\u011Blen\u00ED intenzity laserov\u00E9ho sv\u011Btla rozpt\u00FDlen\u00E9ho z libovoln\u00FDch povrch\u016F pevn\u00FDch t\u011Bles. Nastaviteln\u00E9 polohy jeho jednotliv\u00FDch mechanick\u00FDch \u010D\u00E1st\u00ED umo\u017E\u0148uj\u00ED m\u011B\u0159it rozptyl sv\u011Btla na studovan\u00E9m povrchu p\u0159i jeho r\u016Fzn\u00FDch orientac\u00EDch v\u016F\u010Di dopadaj\u00EDc\u00EDmu laserov\u00E9mu svazku (He-Ne laser pracuj\u00EDc\u00ED na vlnov\u00E9 d\u00E9lce 632,8 nm resp. Ar-Kr laser laditeln\u00FD na 12 vlnov\u00FDch d\u00E9lek vystupuj\u00EDc\u00EDho sv\u011Btla ve viditeln\u00E9 oblasti spektra) v cel\u00E9 hemisf\u00E9\u0159e nad dan\u00FDm povrchem (st\u0159ed hemisf\u00E9ry je toto\u017En\u00FD se st\u0159edem oz\u00E1\u0159en\u00E9 plochy povrchu) s krokem dan\u00FDm p\u0159ij\u00EDmac\u00EDm \u00FAhlem fotodiody (HAMAMATSU S1226-5BQ, d\u00E9lka hrany aktivn\u00ED plochy diody je rovna 2.4 mm, vzd\u00E1lenost dioda - st\u0159ed oz\u00E1\u0159en\u00E9 plochy povrchu je rovna 250 mm, nenulov\u00E1 spektr\u00E1ln\u00ED citlivost v rozsahu vlnov\u00FDch d\u00E9lek 190 nm a\u017E 1000 nm), kter\u00E1 je pou\u017Eita jako detektor intenzity rozpt\u00FDlen\u00E9ho sv\u011Btla. Pohyb p\u0159\u00EDslu\u0161n\u00FDch mechanick\u00FDch \u010D\u00E1st\u00ED SM" . . . . . "P\u0159\u00EDstroj k m\u011B\u0159en\u00ED rozptylu laserov\u00E9ho sv\u011Btla z povrchu pevn\u00FDch t\u011Bles" . . "P\u0159\u00EDstroj k m\u011B\u0159en\u00ED rozptylu laserov\u00E9ho sv\u011Btla z povrchu pevn\u00FDch t\u011Bles" . "26210" . "ligtht scattering, instrumentation"@en . "Ohl\u00EDdal, Miloslav" . . "RIV/00216305:26210/08:PR23891!RIV10-MSM-26210___" . . . . "Apparatus for measurement of laser light scattering from surfaces of solids"@en . . . . "Anto\u0161, Martin" . "[9843BA7C70B1]" . "P\u0159\u00EDstroj k m\u011B\u0159en\u00ED rozptylu laserov\u00E9ho sv\u011Btla z povrchu pevn\u00FDch t\u011Bles"@cs . "Petrilak, Michal" . "N\u00E1klady na v\u00FDvoj za\u0159\u00EDzen\u00ED: 1 200 000 K\u010D. Za\u0159\u00EDzen\u00ED bylo vyu\u017Eito p\u0159i \u0159e\u0161en\u00ED projektu MPO, ev. \u010D. FT-TA3/142 ( Anal\u00FDza optick\u00FDch vlastnost\u00ED sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F) a projektu MPO, ev. \u010D. FT-TA5/114 (V\u00FDvoj technologie vytv\u00E1\u0159en\u00ED PECVD vr" . "389669" . "P\u0159\u00EDstroj k m\u011B\u0159en\u00ED rozptylu laserov\u00E9ho sv\u011Btla z povrchu pevn\u00FDch t\u011Bles"@cs . "Malina, Radom\u00EDr" . "\u00DAFI FSI VUT v Brn\u011B, Technick\u00E1 2896/2 616 69 Brno Laborato\u0159 koheren\u010Dn\u00ED optiky, A2/218" . . . . . "Gr\u00FCndling, Vladim\u00EDr" . .