"2"^^ . . "Potentialities of optical profilometer MicroProf FRT for surface quality measurement" . . "Potentialities of optical profilometer MicroProf FRT for surface quality measurement" . . . . "2"^^ . . . "Optical metrology, surface quality"@en . "RIV/00216305:26210/05:PU54583" . . "Nitra" . "0-8194-5951-8" . "Potentialities of optical profilometer MicroProf FRT for surface quality measurement"@en . . "26210" . "537247" . "14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics" . "6"^^ . . "Potentialities of optical profilometer MicroProf FRT for surface quality measurement"@en . . "RIV/00216305:26210/05:PU54583!RIV10-GA0-26210___" . "SPIE - The internationalSociety for Optical Engineering" . . "Bellingham, Washington, USA" . . "Principle, parameters and selected applications of the optical profilometer MicroProf FRT are presented."@en . "[70A702375AFE]" . "2004-09-13+02:00"^^ . . . "Principle, parameters and selected applications of the optical profilometer MicroProf FRT are presented." . "P(GA101/01/1104)" . . "P\u00E1len\u00EDkov\u00E1, Kate\u0159ina" . "Ohl\u00EDdal, Miloslav" .