"RIV/00216305:26210/03:PU41981!RIV06-GA0-26210___" . "TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)" . "TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)"@en . . . . "ECOSS 22 CD" . "TOF-LEIS anal\u00FDza ultratenk\u00FDch vrstev: r\u016Fst vrsten Ga a GaN na Si (111)"@cs . . "2003-09-08+02:00"^^ . "P(GA202/02/0767), P(ME 334), P(ME 480), Z(MSM 262100002)" . "5"^^ . . "B\u00E1bor, Petr" . "TOF-LEIS anal\u00FDza ultratenk\u00FDch vrstev: r\u016Fst vrsten Ga a GaN na Si (111)"@cs . . . "0-1" . . "5"^^ . "TOF-LEIS, Ga, GaN,"@en . "\u0160ikola, Tom\u00E1\u0161" . "In-situ monitorov\u00E1n\u00ED r\u016Fstu tenk\u00FDch vrstev Ga a GaN a jejich strukturn\u00ED anal\u00FDza pomoc\u00ED TOF-LEIS."@cs . . . . . . . "Kol\u00EDbal, Miroslav" . . "[F07314F16465]" . "2"^^ . . "26210" . "Pr\u016F\u0161a, Stanislav" . "TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)"@en . "631114" . "In-situ monitoring of thin Ga and GaN layers growth and TOF-LEIS structural analysis." . . "Praha" . "Praha" . . . "F\u00DA AV \u010CR" . . "In-situ monitoring of thin Ga and GaN layers growth and TOF-LEIS structural analysis."@en . "RIV/00216305:26210/03:PU41981" . . "Bauer, Petr" . "TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)" . . . .