"Deposition and in situ characterization of ultra-thin films"@en . "26210" . "Spousta, Ji\u0159\u00ED" . "Deposition of ultra-thin GaN layers and their analysis using XPS, SIMS, TOF-LEIS." . . . "RIV/00216305:26210/03:PU41935" . . . "Mach, Jind\u0159ich" . . "\u010Cechal, Jan" . "P(GA202/02/0767), P(ME 334), V, Z(MSM 262100002)" . "\u0160ikola, Tom\u00E1\u0161" . . . . "EVC'03 Abstracts" . "Berlin" . "[8D92D0C85CCC]" . "GaN, XPS, thin films"@en . . "Berlin" . . "RIV/00216305:26210/03:PU41935!RIV11-MSM-26210___" . . "B\u00E1bor, Petr" . "EVC" . . . . "Deposition and in situ characterization of ultra-thin films"@en . . . . . . "Deposition of ultra-thin GaN layers and their analysis using XPS, SIMS, TOF-LEIS."@en . . "603093" . "Kol\u00EDbal, Miroslav" . . . . "Voborn\u00FD, Stanislav" . . "8"^^ . "2"^^ . . . "Deposition and in situ characterization of ultra-thin films" . "8"^^ . "Pr\u016F\u0161a, Stanislav" . . "Deposition and in situ characterization of ultra-thin films" . "2003-06-23+02:00"^^ .