"Surface structure, surface roughness parameters, roughness parameter upper limit, basic length, representative value of surface roughness parameter"@en . . "Metody objektivn\u00EDho stanovov\u00E1n\u00ED reprezentativn\u00ED hodnoty parametr\u016F struktury povrchu funk\u010Dn\u00EDch ploch."@cs . "Stroj\u00EDrensk\u00E1 technologie" . . "Metody objektivn\u00EDho stanovov\u00E1n\u00ED reprezentativn\u00ED hodnoty parametr\u016F struktury povrchu funk\u010Dn\u00EDch ploch."@cs . . "26210" . . "2002" . . "13-17" . . . "CZ - \u010Cesk\u00E1 republika" . "2"^^ . . "Methods of objective assessment of the representative valueof surface structure parameters"@en . "Va\u010Dk\u00E1\u0159, Josef" . . "3" . . "2"^^ . "Methods of objective assessment of the representative valueof surface structure parameters"@en . "Jakost funk\u010Dn\u00EDch ploch, kter\u00E1 v\u00FDznamn\u00FDm zp\u016Fsobem ovliv\u0148uje u\u017Eitn\u00E9 vlastnosti v\u00FDrobku, je definov\u00E1na mimo jin\u00E9 parametry struktury povrchu. Pro zji\u0161\u0165ov\u00E1n\u00ED skute\u010Dn\u00E9 hodnoty sledovan\u00E9ho parametru na konkr\u00E9tn\u00ED plo\u0161e existuj\u00ED objektivn\u00ED i subjektivn\u00ED metody a postupy. Z\u00E1kladn\u00ED pravidla a postupy pro posuzov\u00E1n\u00ED struktury povrchu definuje \u010CSN EN ISO 4288, kter\u00E1 specifikuje standardn\u00ED pravidla pro porovn\u00E1n\u00ED m\u011B\u0159en\u00FDch hodnot s po\u017Eadovan\u00FDmi hodnotami dan\u00FDch parametr\u016F na v\u00FDkrese nebo v technick\u00E9 dokumentaci. Pro praktickou p\u0159ej\u00EDmku struktury povrchu je \u010Dasto nutn\u00E9 stanovit p\u0159esn\u00E9 postupy jako podklad pro v\u00FDsledn\u00E1 jedn\u00E1n\u00ED mezi odb\u011Bratelem a dodavatelem. Auto\u0159i vypracovali objektivn\u00ED metodu, pomoc\u00ED kter\u00E9 je mo\u017En\u00E9 zcela objektivn\u011B s danou pravd\u011Bpodobnost\u00ED stanovit tzv. reprezentativn\u00ED hodnotu dan\u00E9ho parametru struktury povrchu." . "5"^^ . "S" . . . . . "1211-4162" . . "Jakost funk\u010Dn\u00EDch ploch, kter\u00E1 v\u00FDznamn\u00FDm zp\u016Fsobem ovliv\u0148uje u\u017Eitn\u00E9 vlastnosti v\u00FDrobku, je definov\u00E1na mimo jin\u00E9 parametry struktury povrchu. Pro zji\u0161\u0165ov\u00E1n\u00ED skute\u010Dn\u00E9 hodnoty sledovan\u00E9ho parametru na konkr\u00E9tn\u00ED plo\u0161e existuj\u00ED objektivn\u00ED i subjektivn\u00ED metody a postupy. Z\u00E1kladn\u00ED pravidla a postupy pro posuzov\u00E1n\u00ED struktury povrchu definuje \u010CSN EN ISO 4288, kter\u00E1 specifikuje standardn\u00ED pravidla pro porovn\u00E1n\u00ED m\u011B\u0159en\u00FDch hodnot s po\u017Eadovan\u00FDmi hodnotami dan\u00FDch parametr\u016F na v\u00FDkrese nebo v technick\u00E9 dokumentaci. Pro praktickou p\u0159ej\u00EDmku struktury povrchu je \u010Dasto nutn\u00E9 stanovit p\u0159esn\u00E9 postupy jako podklad pro v\u00FDsledn\u00E1 jedn\u00E1n\u00ED mezi odb\u011Bratelem a dodavatelem. Auto\u0159i vypracovali objektivn\u00ED metodu, pomoc\u00ED kter\u00E9 je mo\u017En\u00E9 zcela objektivn\u011B s danou pravd\u011Bpodobnost\u00ED stanovit tzv. reprezentativn\u00ED hodnotu dan\u00E9ho parametru struktury povrchu."@cs . "653236" . "RIV/00216305:26210/02:PU56100" . "The quality of functional surfaces, influencing in a significant way the utility characteristics of the product, is, among others, specified by the parameters of surface structure. For determination of the effective value of the measured parameter of the given surface there are both objective and subjective methods and procedures. Basic rules and procedures to be applied when considering the surface structure are determined by the Czech standard \u010CSN EN ISO 4288 specifying standard rules for comparison of measured values and required values of parameters in drawings or technical specification. For practical takeover of the surface structure it is often necessary to determine accurate procedures as a basis for final dealings between the customer and supplier. The authors have elaborated an objective method that can be used to determine objectively so called representative value of the surface structure parameter with a given probability."@en . . "[BE5F3EA9DE1B]" . . "Metody objektivn\u00EDho stanovov\u00E1n\u00ED reprezentativn\u00ED hodnoty parametr\u016F struktury povrchu funk\u010Dn\u00EDch ploch." . "Metody objektivn\u00EDho stanovov\u00E1n\u00ED reprezentativn\u00ED hodnoty parametr\u016F struktury povrchu funk\u010Dn\u00EDch ploch." . "Pernik\u00E1\u0159, Ji\u0159\u00ED" . "RIV/00216305:26210/02:PU56100!RIV07-MSM-26210___" .