"We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors."@en . "1"^^ . "RIV/00216305:26110/10:PU91624" . "Noise spectroscopy of shallow traps in CdTe crystals"@en . . . "3" . . . "26110" . "ElectroScope - http://www.electroscope.zcu.cz" . "Noise spectroscopy of shallow traps in CdTe crystals" . "P(GA102/04/0142)" . "Schauer, Pavel" . "Noise spectroscopy of shallow traps in CdTe crystals"@en . "5"^^ . . "274959" . . "RIV/00216305:26110/10:PU91624!RIV11-GA0-26110___" . . "[C3B3E695BE01]" . "1802-4564" . "2010" . . . . "1"^^ . "CZ - \u010Cesk\u00E1 republika" . "Noise spectroscopy of shallow traps in CdTe crystals" . "noise, traps, spectroscopy, CdTE"@en . . . . . . "We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors." . .