"1"^^ . . . "4"^^ . . "Noise Reliability Indicators for Films Resistors" . . "437432" . . "Velke Losiny" . "Akademick\u00E9 nakladatelstv\u00ED CERM" . "Noise Reliability Indicators for Films Resistors"@en . . . . . "Noise, Reliability, Indicator, Film Resistor"@en . "RIV/00216305:26110/07:PU80680" . "Noise Reliability Indicators for Films Resistors" . "Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones."@en . "P(GA102/99/0953), P(GA103/06/0708)" . "Noise Reliability Indicators for Films Resistors"@en . . "[7131879E034B]" . "Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones." . "Schauer, Pavel" . "RIV/00216305:26110/07:PU80680!RIV10-GA0-26110___" . "2007-09-04+02:00"^^ . . . . . "26110" . "Physical and Material Engineering 2007" . . "Brno" . . "978-80-7204-537-2" . . "1"^^ . .