"Optical characterization of As12.6Ge23.8S63.6 thin films was made from transmission spectra measurements using Swanepoel method. Spectral dependences of refractive index were well described by single oscillator model. Raman spectra of initial bulk glasses and evaporated films have shown the presence of the nanoscale intrinsic heterogeneities. Nonlinear optical properties of the films were estimated from optical parameters using different approaches and they were found to be more than two orders of magnitude higher then those of silica glasses" . . . "Stronski, A. V." . . . "331805" . "Optical characterization of As-Ge-S thin films" . "RIV/00216275:25310/09:00008349" . "optical properties; chalcogenide glass; refractive index; optical nonlinearity"@en . . . . "11" . . . . "RO - Rumunsko" . . . "Optical characterization of As-Ge-S thin films"@en . "4"^^ . "RIV/00216275:25310/09:00008349!RIV10-MSM-25310___" . "Journal of Optoelectronics and Advanced Materials" . "1"^^ . . "Optical characterization of As12.6Ge23.8S63.6 thin films was made from transmission spectra measurements using Swanepoel method. Spectral dependences of refractive index were well described by single oscillator model. Raman spectra of initial bulk glasses and evaporated films have shown the presence of the nanoscale intrinsic heterogeneities. Nonlinear optical properties of the films were estimated from optical parameters using different approaches and they were found to be more than two orders of magnitude higher then those of silica glasses"@en . "Optical characterization of As-Ge-S thin films"@en . . . "11" . "Pribylova, H." . "Tolmachov, I. D." . "1454-4164" . "[5D8A093FE603]" . "5"^^ . "25310" . "Vl\u010Dek, Miroslav" . "Optical characterization of As-Ge-S thin films" . . "Z(MSM0021627501)" .