. . "Optical Characterization of Ultra-Thin Iron and Iron Oxide Films"@en . "Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement."@en . . "Zaj\u00ED\u010Dkov\u00E1, Lenka" . . . . "S\u0165ahel, Pavel" . "Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement." . . . "RIV/00216224:14310/09:00028505!RIV10-MSM-14310___" . "1348-0391" . "Medu\u0148a, Mojm\u00EDr" . "e-Journal of Surface Science and Nanotechnology" . . . "Mikul\u00EDk, Petr" . . "Valtr, Miroslav" . "Ne\u010Das, David" . "iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection"@en . "331806" . . "7"^^ . "7" . "[3506866ADA50]" . "14310" . "Optical Characterization of Ultra-Thin Iron and Iron Oxide Films" . . "Franta, Daniel" . "7"^^ . . . . . . "5"^^ . . "Optical Characterization of Ultra-Thin Iron and Iron Oxide Films"@en . "b\u0159ezen" . . "JP - Japonsko" . "P(KAN311610701), Z(MSM0021622410), Z(MSM0021622411)" . . . . "Optical Characterization of Ultra-Thin Iron and Iron Oxide Films" . "RIV/00216224:14310/09:00028505" . . . . .