. . "Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment Processes" . . "1.0"^^ . "1.1699999999999999289"^^ . "EDD54944E872CFBDB81582299B2996024382B8AC" . . . "Metodika hodnocen\u00ED, nov\u011B hodnocen\u00FD v\u00FDsledek, J_neimp \u010Dl\u00E1nek v recenzovan\u00E9m \u010Dasopise, datab\u00E1ze SCOPUS, ISSN ti\u0161t\u011Bn\u00E9 podoby, II. kategorie (ostatn\u00ED obory)." . "http://www.isvav.cz/h10/resultDetail.do?rowId=RIV%2F00216224%3A14310%2F06%3A00016820!RIV10-MSM-14310___"^^ . "12.0"^^ . . . "12.0"^^ . "Materials Science Forum" . "14.039999999999999147"^^ . "14.039999999999999147"^^ . . . . . "RIV/00216224:14310/06:00016820!RIV10-MSM-14310___" .