. "P(GA203/00/0085)" . . "RIV/00216224:14310/04:00011460!RIV08-GA0-14310___" . . . . . . "Ohl\u00EDdal, Ivan" . . "5"^^ . "Jedelsk\u00FD, Jaroslav" . . "Franta, Daniel" . "567839" . . . "6" . . "RIV/00216224:14310/04:00011460" . . "Vliv slo\u017Een\u00ED, exposice a tepeln\u00E9ho zah\u0159\u00EDv\u00E1n\u00ED na optick\u00E9 vlastnosti tenk\u00FDch vrstev As-S chalkogenid\u016F"@cs . "Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films" . "Omasta, Jaroslav" . "1" . "In this paper the influence of the technological conditions, i.e. As concentration, UV iradiation and anealing, on the optical constants, thickness and material parameters of chalcogenide As-S thin films is studied. For determining the values of the parameters mentioned the optical method based on interpreting experimental data consiting of spectral dependences of the transmittance measured at normal incidence and spectral dependences of the ellipsometric quantities measured for several incidence angles is used. Within the interpretation of the experimental data the Jellison-Modine dispersion model is employed. It is shown that this dispersion model is not suitable for interpreting the spectral dependences of the transmittance of the films studied. Moreover, within the interpretation of the experimental data the physical model containing on isotropic inhomogeneous layer covered with a non-absorbing overlayer is employed for representing the films under investigation."@en . "[8528D72B9CC6]" . "10"^^ . . "Frumar, Miroslav" . "Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films"@en . "V \u010Dl\u00E1nku je studov\u00E1n vliv technologick\u00FDch podm\u00EDnek, tj. koncentrace As, UV z\u00E1\u0159en\u00ED a zah\u0159\u00EDv\u00E1n\u00ED, na optick\u00E9 konstanty, tlou\u0161\u0165ku a materi\u00E1lov\u00E9 parametry tenk\u00FDch vrstev chalkogenid\u016F typu As-S. Pro ur\u010Den\u00ED hodnot t\u011Bchto parametr\u016F je vyu\u017Eita optick\u00E1 metoda zalo\u017Een\u00E1 na interpretaci experiment\u00E1ln\u00EDch dat sest\u00E1vaj\u00EDc\u00EDch se spektr\u00E1ln\u00EDch z\u00E1vislost\u00ED propustnosti m\u011B\u0159en\u00E9 p\u0159i kolm\u00E9m dopadu sv\u011Btla a spektr\u00E1ln\u00EDch z\u00E1vislost\u00ED elipsometrick\u00FDch veli\u010Din m\u011B\u0159en\u00FDch v n\u011Bkolika \u00FAhlech dopadu. V r\u00E1mci interpretace experiment\u00E1ln\u00EDch dat je vyu\u017Eit Jellison-Modine dispersn\u00ED model. V pr\u00E1ci jsme uk\u00E1z\u00E1no, \u017Ee tento dispersn\u00ED model nen\u00ED vhodn\u00FD pro interpretaci spektr\u00E1ln\u00EDch z\u00E1vislost\u00ED propustnosti studovan\u00FDch tenk\u00FDch vrstev. Nav\u00EDc je p\u0159i interpretaci experiment\u00E1ln\u00EDch dat vyu\u017Eit fyzik\u00E1ln\u00ED model obsahuj\u00EDc\u00ED isotropn\u00ED nehomogenn\u00ED vrstvu pokrytou neabsorbuj\u00EDc\u00ED povrchovou vrstvou."@cs . . "As-S chalcogenide films; Ellipsometry; Combined spectrophotometric method; Amorphous materials; Optical constants"@en . . "139-148" . "1454-4164" . "Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films" . . "14310" . . "Journal of Optoelectronics and Advanced Materials" . "Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films"@en . "RO - Rumunsko" . "3"^^ . "Vliv slo\u017Een\u00ED, exposice a tepeln\u00E9ho zah\u0159\u00EDv\u00E1n\u00ED na optick\u00E9 vlastnosti tenk\u00FDch vrstev As-S chalkogenid\u016F"@cs . "In this paper the influence of the technological conditions, i.e. As concentration, UV iradiation and anealing, on the optical constants, thickness and material parameters of chalcogenide As-S thin films is studied. For determining the values of the parameters mentioned the optical method based on interpreting experimental data consiting of spectral dependences of the transmittance measured at normal incidence and spectral dependences of the ellipsometric quantities measured for several incidence angles is used. Within the interpretation of the experimental data the Jellison-Modine dispersion model is employed. It is shown that this dispersion model is not suitable for interpreting the spectral dependences of the transmittance of the films studied. Moreover, within the interpretation of the experimental data the physical model containing on isotropic inhomogeneous layer covered with a non-absorbing overlayer is employed for representing the films under investigation." . .