"Z(MSM 143100002)" . . . "temperature; ellipsometric spectra; poly(methyl-phenylsilane)"@en . "4"^^ . "455/2004" . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . . "Thin Solid Films" . . . "Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)"@en . "Souhrnn\u00E1 studie teplotn\u00ED z\u00E1vislosti UV-VIS elipsometrick\u00FDch spekter tenk\u00FDch vrstev poly(methyl-phenylsilanu). Byl nalezen pr\u00E1h nevratn\u00FDch zm\u011Bn optick\u00E9 odezvy na 373 K a d\u00E1le pr\u016Fm\u011Brn\u00FD teplotn\u00ED posuv nejni\u017E\u0161\u00EDho excitonov\u00E9ho p\u00E1su v oblasti vratn\u00FDch zm\u011Bn. Efekt \u017E\u00EDh\u00E1n\u00ED pod a nad 373 K byl studov\u00E1n p\u0159i n\u00EDzk\u00E9m a vysok\u00E9m stupni UV expozice."@cs . . "0040-6090" . "5"^^ . . . "RIV/00216224:14310/04:00010108" . "Nebojsa, Alois" . . . "[DF2809B0BBF4]" . . . "Fikarov\u00E1 Zrzaveck\u00E1, Olga" . "14310" . "589794" . "Teplotn\u00ED z\u00E1vislost elipsometrick\u00FDch spekter poly(methyl-phenylsilanu)"@cs . . . "RIV/00216224:14310/04:00010108!RIV08-MSM-14310___" . "Navr\u00E1til, Karel" . . . "Teplotn\u00ED z\u00E1vislost elipsometrick\u00FDch spekter poly(methyl-phenylsilanu)"@cs . "Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)" . "Ne\u0161p\u016Frek, Stanislav" . "Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)" . "Huml\u00ED\u010Dek, Josef" . "may" . "5"^^ . . . "278-282" . "Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)"@en . "Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light."@en . "Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light." .