"http://iopscience.iop.org/2043-6262/4/2/025004/" . . . . . "11"^^ . . . "Tarnawski, Z." . "RIV/00216208:11320/13:10190410!RIV14-MSM-11320___" . "Drogowska, K." . "Zakrzewska, K." . "4" . "Sechovsk\u00FD, Vladim\u00EDr" . . . "Multilayered thin films of Ti-TiO 2 system have been investigated, focusing on all of the important parameters in both photocatalysis and H storage. Numerous Ti-TiO 2 thin films with a single-, bi- and tri-layered structure have been deposited on different substrates by means of dc pulsed magnetron sputtering from a metallic Ti target in an inert Ar or reactive Ar + O 2 atmosphere. The film chemical composition, depth profile, layer thickness and structure were determined by combined analysis of x-ray diffraction, x-ray reflectometry, Rutherford back- scattering and optical reflectivity spectra. The results show that the Ti films deposited on Si(111) exhibit a strong preferred orientation with the (00.1) plane parallel to the substrate, while a columnar structure was developed for TiO 2 films. H charging at 1 bar and at 300 oC revealed that, in the case of the tri-layered structure of Ti/TiO 2 /Ti/Si(111), H diffused through the TiO 2 layer without any accumulation in it. Pd acts as a catalyst for gathering H in Ti layers and up to 50% of H is stored in the topmost and bottom Ti layers. The preferential orientation in the Ti films was found to be destroyed upon hydrogenation at 100 bar. The hydride TiH x phase ( x < 0.66) was formed under such a high H pressure."@en . "78478" . "Nhu-Tarnawska, K." . "9"^^ . "10.1088/2043-6262/4/2/025004" . "Balogh, A. G." . "Hydrogen storage in Ti-TiO 2 multilayers" . . . "Multilayered thin films of Ti-TiO 2 system have been investigated, focusing on all of the important parameters in both photocatalysis and H storage. Numerous Ti-TiO 2 thin films with a single-, bi- and tri-layered structure have been deposited on different substrates by means of dc pulsed magnetron sputtering from a metallic Ti target in an inert Ar or reactive Ar + O 2 atmosphere. The film chemical composition, depth profile, layer thickness and structure were determined by combined analysis of x-ray diffraction, x-ray reflectometry, Rutherford back- scattering and optical reflectivity spectra. The results show that the Ti films deposited on Si(111) exhibit a strong preferred orientation with the (00.1) plane parallel to the substrate, while a columnar structure was developed for TiO 2 films. H charging at 1 bar and at 300 oC revealed that, in the case of the tri-layered structure of Ti/TiO 2 /Ti/Si(111), H diffused through the TiO 2 layer without any accumulation in it. Pd acts as a catalyst for gathering H in Ti layers and up to 50% of H is stored in the topmost and bottom Ti layers. The preferential orientation in the Ti films was found to be destroyed upon hydrogenation at 100 bar. The hydride TiH x phase ( x < 0.66) was formed under such a high H pressure." . "I" . "Hydrogen storage in Ti-TiO 2 multilayers"@en . "3"^^ . "Ku\u017Eel, Radom\u00EDr" . . . "2" . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . "Hydrogen storage in Ti-TiO 2 multilayers"@en . "Hydrogen storage in Ti-TiO 2 multilayers" . "Havela, Ladislav" . "11320" . "2043-6262" . . . "Brudnik, A." . . "RIV/00216208:11320/13:10190410" . "multilayers; Ti-TiO; storage; Hydrogen"@en . "[542ECE47299E]" . . . . "Advances in Natural Sciences: Nanoscience and Nanotechnology" .