. . "Mikroskopie atom\u00E1rn\u00EDch sil (AFM), transmisn\u00ED elektronov\u00E1 mikroskopie (TEM) a rastrovac\u00ED elektronov\u00E1 mikroskopie (SEM) desti\u010Dkovit\u00FDch nano\u010D\u00E1stic jin\u00E9 f\u00E1ze"@cs . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles" . "410994" . . . "RIV/00216208:11320/07:00004741!RIV08-MSM-11320___" . "Mikroskopie atom\u00E1rn\u00EDch sil (AFM), transmisn\u00ED elektronov\u00E1 mikroskopie (TEM) a rastrovac\u00ED elektronov\u00E1 mikroskopie (SEM) desti\u010Dkovit\u00FDch nano\u010D\u00E1stic jin\u00E9 f\u00E1ze"@cs . "2427;2460" . . "1478-6435" . . . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles"@en . "87" . "11320" . . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles" . . "17" . . "34"^^ . . "RIV/00216208:11320/07:00004741" . "8"^^ . . . . . . "Philosophical Magazine" . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles"@en . "[8FDFB9F00A64]" . "Pe\u0161i\u010Dka, Josef" . . . "Mikroskopie atom\u00E1rn\u00EDch sil (AFM), transmisn\u00ED elektronov\u00E1 mikroskopie (TEM) a rastrovac\u00ED elektronov\u00E1 mikroskopie (SEM) desti\u010Dkovit\u00FDch nano\u010D\u00E1stic jin\u00E9 f\u00E1ze"@cs . "1"^^ . . "Atomic; force; microscopy; transmission; electron; microscopy; scanning; electron; microscopy; nanoscale; plate-shaped; second; phase; particles"@en . "Z(MSM0021620834)" . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . . . . . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles" . "Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles"@en .