. . "0"^^ . . "Dal\u0161\u00ED rozvoj nenab\u00EDjej\u00EDc\u00ED rastrovac\u00ED elektronov\u00E9 mikroskopie nevodiv\u00FDch vzork\u016F" . . . "Navrhovan\u00FD projekt bezprost\u0159edn\u011B navazuje na grantov\u00FD projekt 202/96/0961, v r\u00E1mci n\u011Bho\u017E byla ov\u011B\u0159ena a vypracov\u00E1na metoda nenab\u00EDjej\u00EDc\u00ED rastrovac\u00ED elektronov\u00E9 mikroskopie vyu\u017E\u00EDvaj\u00EDc\u00ED kritick\u00FDch energi\u00ED dopadaj\u00EDc\u00EDch elektron\u016F, p\u0159i nich\u017E je celkov\u00FD v\u00FDt\u011B\u017Eekemitovan\u00FDch elektron\u016F roven jedn\u00E9 a v prepar\u00E1tu se nehromad\u00ED \u017E\u00E1dn\u00FD n\u00E1boj. V p\u0159edchoz\u00EDm projektu, v\u011Bnovan\u00E9m p\u0159edev\u0161\u00EDm m\u011B\u0159en\u00ED kritick\u00FDch energi\u00ED, byla metoda dota\u017Eena do stavu automatick\u00E9 procedury syst\u00E9mu \u0159\u00EDzen\u00ED mikroskopu po\u010D\u00EDta\u010Dem, v n\u00ED\u017E je nalezena kritick\u00E1 energie a po\u0159\u00EDzen sn\u00EDmek prepar\u00E1tu nezkreslen\u00FD projevy nab\u00EDjen\u00ED nevodiv\u00E9ho povrchu. Navrhovan\u00FD projekt zahrnuje vypracov\u00E1n\u00ED teoretick\u00E9ho modelu procesu m\u011B\u0159en\u00ED hodnoty nenab\u00EDjej\u00EDc\u00ED energie elektron\u016F prost\u0159ednictv\u00EDm sn\u00EDm\u00E1n\u00ED \u010Dasov\u00E9ho v\u00FDvoje sign\u00E1lucelkov\u00E9 emise elektron\u016F, kter\u00FD by m\u011Bl poskytnout podklady pro optimalizaci tohoto postupu, zejm\u00E9na s ohledem na p\u0159esnost a spolehlivost v\u00FDsledku u citliv\u00FDch a heterogenn\u00EDch prepar\u00E1t\u016F. Nejd\u016Fle\u017Eit\u011Bj\u0161\u00EDm c\u00EDlem navrhovan\u00E9ho projektu je rozpracov\u00E1n\u00ED metody nen" . . . "1"^^ . . "2003-04-01+02:00"^^ . "0"^^ . . "The proposed project represents a continuation of the project no. 202/96/0961, in which the non-charging scanning electron microscopy method has been verified and elaborated. The method makes use of the critical energies of the electron impact at which the total yield of the emitted electron equals unity, so that no charge is dissipated into the specimen. The preceding project was mainly devoted to measurement of the critical energies, and the method is being advanced to an automatic routine of the computerized control system which finds the proper energy and creates an uncharged image. The proposed project includes the elaboration of a theoretical model of the critical energy measurement by means of the time development of the total electron emission. This model should contribute to method optimization, particularly as regards the accuracy and reliability of the results for sensitive and heterogeneous specimens. The main goal is to fit the noncharging microscopy method for some of its key im"@en . . . "Further development of the non-charging scanning electron microscopy of non-conductive specimens"@en . . . "http://www.isvav.cz/projectDetail.do?rowId=GA202/99/0008"^^ . "Byla propracov\u00E1na metoda ur\u010Dov\u00E1n\u00ED nenab\u00EDjej\u00EDc\u00ED energie elektron\u016F v rastrovac\u00ED elektronov\u00E9 mikroskopii prost\u0159ednictv\u00EDm sn\u00EDm\u00E1n\u00ED \u010Dasov\u00E9ho v\u00FDvoje sign\u00E1lu emise elektron\u016F a vypracov\u00E1n teoretick\u00FD model procesu. Metoda umo\u017E\u0148uje optimalizaci podm\u00EDnek pro z\u00EDsk\u00E1n\u00ED"@cs . "Neuvedeno."@en . "GA202/99/0008" . "8"^^ . . . "8"^^ . .