. "9"^^ . . . . . . "http://www.isvav.cz/projectDetail.do?rowId=GA202/98/P285"^^ . . . . . "The laboratory version of the holographic confocal microscope (HCM) is finished in the frame of the carrier project. The imaging parameters of HCM are comparable with those of conventional confocal microscopes. The out-of-focus images and scattered lightare suppressed by HCM and a thin optical section of a specimen is imaged only. Hence, the three-dimensional image of the specimen surface can be reconstructed from a collection of thus obtained optical slices. In contrast to a conventional confocal microscope, which enables only the detection of the image intensity, HCM has the advantage of the detection of both the image intensity and the image phase. Processing of the phase image component can substantially increase the depth resolution of surfacprofiling. The aim of the project is the development and the experimental verification of the surface-reconstruction methods based on processing of the phase and intensity image components produced by HCM, applicable to both reflecting and diffuse specim"@en . . "2003-04-01+02:00"^^ . "Neuvedeno."@en . . "0"^^ . "Surface profiling by a holographic confocal microscopy"@en . . "V r\u00E1mci nosn\u00E9ho projektu je dokon\u010Dov\u00E1na laboratorn\u00ED verze tzv. holografick\u00E9ho konfok\u00E1ln\u00EDho mikroskopu (HKM), kter\u00FD prokazateln\u011B vytv\u00E1\u0159\u00ED zobrazen\u00ED, jen\u017E je charakterem i parametry srovnateln\u00E9 se zobrazen\u00EDm v konven\u010Dn\u00EDm konfok\u00E1ln\u00EDm mikroskopu. Proto, podobn\u011B jako konven\u010Dn\u00ED konfok\u00E1ln\u00ED mikroskopy, tak\u00E9 HKM odsti\u0148uje rozost\u0159en\u00E1 zobrazen\u00ED a rozpt\u00FDlen\u00E9 sv\u011Btlo a zobrazuje pouze oblast vzorku le\u017E\u00EDc\u00ED v t\u011Bsn\u00E9 bl\u00EDzkosti p\u0159edm\u011Btov\u00E9 roviny mikroobjektivu. Tak je mo\u017Eno prov\u00E1d\u011Bt optick\u00E9 \u0159ezy trojrozm\u011Brn\u00FDmi vzorky rekonstrukce profilu povrch\u016F odrazn\u00FDch vzork\u016F. Konven\u010Dn\u00ED konfok\u00E1ln\u00ED mikroskop umo\u017E\u0148uje sn\u00EDmat intenzitu zobrazen\u00ED. Podstatnou v\u00FDhodou HKM je detekce rozlo\u017Een\u00ED intenzity i f\u00E1ze sv\u011Bteln\u00E9 vlny v optick\u00E9m \u0159ezu, jen\u017E umo\u017E\u0148uje z\u00EDskat dodate\u010Dnou informaci o zobrazovan\u00E9m objektu. V p\u0159\u00EDpad\u011B rekonstrukce profilu povrchu odrazn\u00E9ho objektu je zpracov\u00E1n\u00EDm f\u00E1zov\u00E9 slo\u017Eky zobrazen\u00ED mo\u017Eno velmi v\u00FDznamn\u011B zv\u00FD\u0161it citlivost profilov\u00E1n\u00ED a dos\u00E1hnout p\u0159esnosti zlomku vlnov\u00E9 d\u00E9lky pou\u017Eit\u00E9ho sv\u011Btla.C\u00EDlem p\u0159edlo\u017Een\u00E9ho projektu" . . "1"^^ . "Profilov\u00E1n\u00ED povrch\u016F pomoc\u00ED holografick\u00E9 konfok\u00E1ln\u00ED mikroskopie" . . . "GA202/98/P285" . "0"^^ . . "Z\u00EDskan\u00E9 v\u00FDsledky jsou obsahem publikac\u00ED v \u010Dasopisech, zvan\u00E9 p\u0159edn\u00E1\u0161ky, poster\u016F na konferenc\u00EDch a habilita\u010Dn\u00ED pr\u00E1ce \u0159e\u0161itele. Grantov\u00E1 pravidla byla dodr\u017Eena a finan\u010Dn\u00ED prost\u0159edky byly \u010Derp\u00E1ny ve schv\u00E1len\u00E9 struktu\u0159e a celkov\u00E9 v\u00FD\u0161i."@cs . "9"^^ .