"2009-01-15+01:00"^^ . . . "The main goal of the proposed project, i.e. the explanation of the relationship between the real structure and microstructure of the thin film nanocomposites, the deposition technology and the material properties, through the detailed investigation of th"@en . . "Hlavn\u00EDm c\u00EDlem p\u0159edkl\u00E1dan\u00E9ho projektu je studium mikrostruktury nanokrystalick\u00FDch tenk\u00FDch vrstev jako dominantn\u00EDho faktoru, kter\u00FD ovliv\u0148uje jejich vlastnosti. Tohoto c\u00EDle bude dosa\u017Eeno pomoc\u00ED komplexn\u00ED charakterizace re\u00E1ln\u00E9 struktury nanokrystalick\u00FDchmateri\u00E1l\u016F s vyu\u017Eit\u00EDm rtg. difrakce, kter\u00E1 bude zahrnovat f\u00E1zovou anal\u00FDzu, stanoven\u00ED mikronap\u011Bt\u00ED a zbytkov\u00FDch nap\u011Bt\u00ED, a ur\u010Den\u00ED velikosti a p\u0159ednostn\u00ED orientace krystalit\u016F. Sou\u010Dasn\u011B s t\u00EDm bude vy\u0161et\u0159ov\u00E1na krystalografick\u00E1 anizotropie v\u00FD\u0161e uveden\u00FDchparametr\u016F a korelov\u00E1na s morfologi\u00ED tenk\u00FDch vrstev a s anizotropi\u00ED materi\u00E1lov\u00FDch charakteristik. Rtg. difrak\u010Dn\u00ED m\u011B\u0159en\u00ED budou dopln\u011Bna v\u00FDsledky XPS, GDOES, RBS, TEM a HRTEM. V r\u00E1mci navrhov\u00E9ho projektu budou vy\u0161et\u0159ov\u00E1ny p\u0159edev\u0161\u00EDm nanokrystalick\u00E9 tenk\u00E9vrstvy UN a TiBN. Nitridy uranu jsou studov\u00E1ny kv\u016Fli zaj\u00EDmav\u00FDm magnetick\u00FDm vlastnostem; nanokrystalick\u00E9 TiBN vrstvy kv\u016Fli vynikaj\u00EDc\u00EDm mechanick\u00FDm vlastnostem a dobr\u00E9 chemick\u00E9 stabilit\u011B. Pro ov\u011B\u0159en\u00ED spolehlivosti v\u00FDsledk\u016F difrak\u010Dn\u00EDch m\u011B\u0159en\u00ED budou" . "0"^^ . . "GA106/03/0819" . . . "1"^^ . . . "The main goal of the research project is the investigation of the microstructure of nanocrystalline thin films as a factor, which dominantly influences the material properties. This will be performed via complex characterisation of the real structure ofnanocrystalline thin films using X-ray diffraction, which will include phase analysis, microstrain and residual stress analysis, and the analysis of the size and preferred orientation of crystallites. Additionally, the crystallographic anisotropy of theabove parameters will be investigated and related to the morphology of thin films and to the anisotropy of materials characteristics. XRD measurements will be complemented by results of XPS, GDOES, RBS, TEM and HRTEM. Within the proposed project, mainlyUN and TiBN nanocrystalline thin films will be investigated. Uranium nitrides are studied because of their interesting magnetic properties, nanocrystalline TiBN thin films due to their outstanding mechanical properties and good chemical stability. To"@en . . "1"^^ . . . . . . "Real structure of nanocrystalline thin films studied using X-ray diffraction"@en . "Hlavn\u00ED c\u00EDle \u0159e\u0161en\u00E9ho projektu,\u00A0tj.\u00A0vysv\u011Btlen\u00ED souvislosti mezi re\u00E1lnou strukturou a mikrostrukturou\u00A0tenkovrstevn\u00FDch nanokompozit\u016F, depozi\u010Dn\u00EDmi podm\u00EDnkami a materi\u00E1lov\u00FDmi vlastnostmi pomoc\u00ED popisu re\u00E1ln\u00E9 struktury a mikrostruktury tenk\u00FDch vrstev pomoc\u00ED rt"@cs . . . "http://www.isvav.cz/projectDetail.do?rowId=GA106/03/0819"^^ . "5"^^ . . . "Studium re\u00E1ln\u00E9 struktury nanokrystalick\u00FDch tenk\u00FDch vrstev pomoc\u00ED rtg. difrakce" . "Neuvedeno."@en . "5"^^ . . . .