"0"^^ . . "http://www.isvav.cz/projectDetail.do?rowId=GA102/05/0886"^^ . . . "Investigation of the true secondary electrons detection systems in the newly conceived environmental scanning electron microscope"@en . . "2007-12-31+01:00"^^ . "39"^^ . "1"^^ . "2005-01-01+01:00"^^ . "39"^^ . "1"^^ . "\u0158e\u0161en\u00ED projektu p\u0159ineslo nov\u00E9 poznatky v oblasti detekce sekund\u00E1rn\u00EDch elektron\u016F v environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00E9 mikroskopii (EREM), a to jak scintila\u010Dn\u011B foton\u00E1sobi\u010Dov\u00FDm detektorem sekund\u00E1rn\u00EDch elektron\u016F, tak ioniza\u010Dn\u00EDm a segmentov\u00FDm ioniza\u010Dn\u00EDm d"@cs . . . . . "The solution of the grant project brought new knowledge about the detection of secondary electrons in environmental scanning electron microscopy (ESEM) both by the scintillation-photomultiplier detectors of secondary electrons and by ionization and segme"@en . "environmental microscope; secondary electrons; scintillation detector"@en . . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00E1 mikroskopie (EREM) se \u0159ad\u00ED k posledn\u00EDm trend\u016Fm mikroskopick\u00FDch metod. Umo\u017E\u0148uje pracovat v komo\u0159e vzorku s tlaky vy\u0161\u0161\u00EDmi ne\u017E ve standardn\u00EDm REM (cca. 103Pa oproti 10-3Pa) a pozorovat vzorky v jejich p\u0159irozen\u00E9m vlhk\u00E9mstavu bez p\u0159edchoz\u00ED preparace a bez ne\u017E\u00E1douc\u00EDch nab\u00EDjec\u00EDch artefakt\u016F na jejich povrchu. Byla vy\u0159e\u0161ena cel\u00E1 \u0159ada probl\u00E9m\u016F spojen\u00FDch s touto metodikou, nicm\u00E9n\u011B n\u011Bkter\u00E9 nedostatky z\u016Fst\u00E1vaj\u00ED nedo\u0159e\u0161eny. Projekt se zab\u00FDv\u00E1 jedn\u00EDm z nich - detekc\u00ED prav\u00FDch sekund\u00E1rn\u00EDch elektron\u016F zp\u016Fsobem, kter\u00FD zcela potla\u010Duje vliv ne\u017E\u00E1douc\u00EDch zp\u011Btn\u011B odra\u017Een\u00FDch elektron\u016F. Princip detekce spo\u010D\u00EDv\u00E1 v ods\u00E1v\u00E1n\u00ED sekund\u00E1rn\u00EDch elektron\u016F ze vzorku um\u00EDst\u011Bn\u00E9ho v prost\u0159ed\u00ED vysok\u00E9ho tlaku plynu do prost\u0159ed\u00ED vysok\u00E9ho vakua v n\u011Bm\u017E je um\u00EDst\u011Bn scintil\u00E1tor s vysok\u00FDm elektrodov\u00FDm potenci\u00E1lem. Sekund\u00E1rn\u00ED elektrony jsou ods\u00E1v\u00E1ny pomoc\u00ED n\u00EDzk\u00E9ho elektrostatick\u00E9ho pole do dvou komor s diferenci\u00E1ln\u011B \u010Derpan\u00FDm tlakem plynu. Tyto komory jsou odd\u011Bleny aperturn\u00EDmi clonami tvo\u0159\u00EDc\u00EDmi sou\u010Dasn\u011B" . "GA102/05/0886" . . "V\u00FDzkum detek\u010Dn\u00EDch syst\u00E9m\u016F prav\u00FDch sekund\u00E1rn\u00EDch elektron\u016F v nov\u011B koncipovan\u00E9m environment\u00E1ln\u00EDm rastrovac\u00EDm elektronov\u00E9m mikroskopu" . " secondary electrons" . . . . . "environmental microscope" . "2007-05-02+02:00"^^ . . "2008-12-16+01:00"^^ . . . "Environmental scanning electron microscopy (ESEM) belongs to the last trends of microscopic methods. It enables working in the specimen chamber with pressures higher than in a standard SEM (approx. 103Pa in comparison with 10-3Pa) and observation of specimens in their natural wet state without previous preparation. A number of problems connected with this methodology has been solved, nevertheless, several imperfections are not finished yet. The project deals with one of them - detection of true secondary electrons using a way totally suppressing the influence of undesirable backscattered electrons. The principle of the detection is the exhaust of secondary electrons from the specimen placed in the environment of high pressure of gas to the environment of high vacuum, in which the scintillator with high electrode potential is placed. The secondary electrons are exhausted using the low electrostatic field to the space of two chambers with differentially pumped pressure of gas. These chambers"@en . . . .