"Projekt zahrnuje experiment\u00E1ln\u00ED a aplika\u010Dn\u00ED pr\u00E1ce v oblasti diagnostiky \u010D\u00EDslicov\u00FDch syst\u00E9m\u016F, s d\u016Frazem na generov\u00E1n\u00ED testovac\u00EDch vzork\u016F. C\u00EDlem projektu je zejm\u00E9na: Pokra\u010Dov\u00E1n\u00ED ve v\u00FDzkumu metodiky n\u00E1vrhu pseudotrivi\u00E1ln\u00EDch gener\u00E1tor\u016F testovac\u00EDch vzork\u016F s" . . . . "The project aims at the experimental and application-oriented research in the field of diagnostics of digital systems with the stress on test pattern generation. The project has the following goals: to continue in the research into the methods of design"@en . "1"^^ . . "1"^^ . . . . . "Metody optimalizace vestav\u011Bn\u00FDch diagnostick\u00FDch prost\u0159edk\u016F v integrovan\u00FDch obvodech" . . "0"^^ . "1. Odborn\u00FD p\u0159\u00EDnos projektu spo\u010D\u00EDv\u00E1 zejm\u00E9na ve vytvo\u0159en\u00ED syst\u00E9mu zpracov\u00E1n\u00ED diagnostick\u00FDch dat COMPAS, vyu\u017Eiteln\u00FD p\u0159i pr\u016Fmyslov\u00FDch n\u00E1vrz\u00EDch 10. D\u00E1le byly vyvinuty 2 nez\u00E1visl\u00E9 metody pro konstrukci vestav\u011Bn\u00E9ho testov\u00E1n\u00ED BIST. Mezi v\u00FDstupy pat\u0159\u00ED kvalitn\u00ED"@cs . "23"^^ . . . . "Neuvedeno."@en . "23"^^ . "GA102/01/0566" . . "Built-in self test equipment optimisation methods in integrated circuits"@en . "http://www.isvav.cz/projectDetail.do?rowId=GA102/01/0566"^^ . . "2008-05-30+02:00"^^ . . . .