"reliability and ageing of eletrical joints" . " hardware" . "*V\u00FDvoj a v\u00FDroba prototypu testovac\u00EDho syst\u00E9mu vyu\u017Eiteln\u00E9ho pro v\u00FDzkum spolehlivosti v integrovan\u00FDch obvodech a plo\u0161n\u00FDch spoj\u00EDch. Zvl\u00E1\u0161tn\u00ED d\u016Fraz je kladen na spolehlivost propojen\u00ED ve vysok\u00E9m proudu a\u017E do 10 A nebo v\u00EDce. Testovac\u00ED syst\u00E9m se skl\u00E1d\u00E1 ze specializovan\u00E9ho hardwaru a softwaru pro \u00FAdr\u017Ebu datab\u00E1z\u00ED a anal\u00FDzu dat." . " database of functional blocks" . "0"^^ . . . "*MERIT - V\u00FDzkum nov\u00FDch technologi\u00ED pro kontaktov\u00E1n\u00ED \u010Dip\u016F integrovan\u00FDch obvod\u016F a v\u00FDvoj m\u011B\u0159ic\u00EDho syst\u00E9mu pro anal\u00FDzu spolehlivosti." . "2009-04-22+02:00"^^ . "1"^^ . "1"^^ . "11"^^ . "11"^^ . . " high current" . . . . "*In this project a test system to be used in investigation and research on reliability of interconnections in integrated circuits and printed circuit boards will be developed and realised. Especially the reliability of interconnections of semmiconductor chips under high current regime until 10 A or more, is emphasised. The test system consists of dedicated hardware, software for database management and for data analysis."@en . . "*MERIT - Measurement environment for the reliability study of interconnection technologies."@en . . . . "Pl\u00E1novan\u00FD c\u00EDl a v\u0161echny v\u00FDstupy (elektronick\u00E1 prezentace, \u010Dl\u00E1nek ve sborn\u00EDku, prototyp, workshop, \u010Dl\u00E1nek v odborn\u00E9m \u010Dasopisu) a technick\u00E9 parametry prototypu testovac\u00EDho za\u0159\u00EDzen\u00ED byly spln\u011Bny."@cs . " test system" . . "2006-03-01+01:00"^^ . . "FT-TA3/013" . " test chip" . " software" . . . . "2009-07-31+02:00"^^ . " test equipment" . . "reliability and ageing of eletrical joints; high current; test system; test equipment; test chip; hardware; software; database of functional blocks; packing and interconnections"@en . . "http://www.isvav.cz/projectDetail.do?rowId=FT-TA3/013"^^ . . "2010-06-21+02:00"^^ . "The aim and all the results (electronic presentation, article in proceedings, prototype, workshop, article in technical journal) and the technical parameters of the test system prototype have been fulfilled."@en . .